Postirradiation behavior of p-channel charge-coupled devices irradiated at 153 K

Gow, Jason; Wood, Daniel; Murray, Neil J.; Burt, David; Hall, D.; Dryer, Ben; Holland, Andrew D.

doi:10.1117/1.jatis.2.2.026001

Cited by 5 publications

(10 citation statements)

References 29 publications

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“…The time between capture and release is dependent on the type of defect and the operational temperature, and is described by the emission time constant. Two different applications of the technique have been explored, the first can be used to identify the type of defect [5][6][19][20] and the second to provide insight into the CTI and provide a simple method of correction [17][18] , it the latter method that is the focus of this paper. It should also be possible to utilise the information about defect type and concentration to support a charge transport model which relies on these variables as inputs.…”

Section: Trap-pumping and Cti Mitigationmentioning

confidence: 99%

Simplified charge transfer inefficiency correction in CCDs by trap-pumping

Gow

Murray

2016

SPIE Proceedings

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A major concern when using Charge-Coupled Devices in hostile radiation environments is radiation induced Charge Transfer Inefficiency. The displacement damage from non-ionising radiation incident on the detector creates defects within the silicon lattice, these defects can capture and hold charge for a period of time dependent on the operating temperature and the type of defect, or "trap species". The location and type of defect can be determined to a high degree of precision using the trap-pumping technique, whereby background charges are input and then shuffled forwards and backwards between pixels many times and repeated using different transfer timings to promote resonant charge-pumping at particular defect sites. Where the charge transfer timings used in the trap-pumping process are equivalent to the nominal CCD readout modes, a simple "trap-map" of the defects that will most likely contribute to charge transfer inefficiency in the CCD array can be quickly generated. This paper describes a concept for how such a "trap-map" can be used to correct images subject to non-ionising radiation damage and provides initial results from an analytical algorithm and our recommendations for future developments.

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Section: Trap-pumping and Cti Mitigationmentioning

confidence: 99%

Simplified charge transfer inefficiency correction in CCDs by trap-pumping

Gow

Murray

2016

SPIE Proceedings

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“…Typically a proton irradiation performed to investigate post-irradiation performance for a space mission is performed at room temperature, however, based on the evidence from other studies looking into the performance of devices irradiated at cryogenic temperatures 3,[6][7][8][9][10][11][12][15][16][17] , this may not provide the conditions to allow appropriate minimisation of radiation induced CTI. This is because of the mobility of individual defects after the irradiation and their ability to interact with other defects to form different defects.…”

Section: Introductionmentioning

confidence: 99%

“…Therefore, immediately there is less concentration of impurities from which stable defects can be formed that could impact charge transfer. The radiation induced defects which increase Charge Transfer Inefficiency (CTI) in a p-channel CCD have been linked to the divacancy and other traps related to carbon and oxygen interstitials [4][5][6][7][8][11][12] . As there are less radiation induced defects in a p-channel CCD which have been shown to increase CTI and because they are formed in smaller quantities (the divacancy is a second order defect and boron defects have not been shown to impact CTE) when compared to an n-channel equivalent, p-channel CCDs are more hard to radiation induced CTI.…”

Section: Introductionmentioning

confidence: 99%

“…The study described in this paper was performed as part of a European Space Agency (ESA) funded investigation (TEC-MME/2012/298) into the performance benefits provided through the use of a p-channel rather than an n-channel CCD [10][11][12] . The overall aim of the study was to build upon our understanding of device behaviour and the impact of performing irradiations at cryogenic temperatures and how the observed defect concentrations linked to CTI measurements.…”

Section: Introductionmentioning

confidence: 99%

“…When considering the number of traps that could form during the irradiation and the capture and emission time of holes, described by Shockley-Read-Hall theory [12][13] , a p-channel CCD should provide more options for optimal timings to be selected. The measured CTI is closely linked to the emission time constant, e, and it will be low if e is very much less than the time allowed to re-join the charge packet (i.e.…”

Section: Introductionmentioning

confidence: 99%

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Charge transfer efficiency in a p-channel CCD irradiated cryogenically and the impact of room temperature annealing

et al. 2016

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It is important to understand the impact of the space radiation environment on detector performance, thereby ensuring that the optimal operating conditions are selected for use in flight. The best way to achieve this is by irradiating the device using appropriate mission operating conditions, i.e. holding the device at mission operating temperature with the device powered and clocking. This paper describes the Charge Transfer Efficiency (CTE) measurements made using an e2v technologies p-channel CCD204 irradiated using protons to the 10 MeV equivalent fluence of 1.24×10 9 protons.cm -2at 153 K. The device was held at 153 K for a period of 7 days after the irradiation before being allowed up to room temperature where it was held at rest, i.e. unbiased, for twenty six hours to anneal before being cooled back to 153 K for further testing, this was followed by a further one week and three weeks of room temperature annealing each separated by further testing. A comparison to results from a previous room temperature irradiation of an n-channel CCD204 is made using assumptions of a factor of two worse CTE when irradiated under cryogenic conditions which indicate that p-channel CCDs offer improved tolerance to radiation damage when irradiated under cryogenic conditions.

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Characterization and Optimization of Skipper CCDs for the SOAR Integral Field Spectrograph

Villalpando,

Drlica-Wagner,

Plazas Malagón

et al. 2024

PASP

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We present results from the characterization and optimization of Skipper charge-coupled devices (CCDs) for use in a focal plane prototype for the Southern Astrophysical Research Integral Field Spectrograph (SIFS). We tested eight Skipper CCDs and selected six for SIFS based on performance results. The Skipper CCDs are 6k × 1k, 15 μm pixels, thick, fully depleted, p-channel devices that have been thinned to ∼250 μm, backside processed, and treated with an anti-reflective coating. We demonstrate a single-sample readout noise of <4.3 e− rms pixel−1 in all amplifiers. We optimize the readout sequence timing to achieve a readout noise of 0.5 e− rms pixel−1 after 74 non-destructive measurements, which can be accomplished in a region covering 5% of the detector area in a readout time of <4 minutes. We demonstrate single-photon-counting in all 24 amplifiers (four amplifiers per detector) with a readnoise of σ N ∼ 0.18 e− rms pixel−1 after N samp = 400 samples, and we constrain the degree of nonlinearity to be ≲1% at low signal levels (0 e− to 50 e−). Clock-induced charge (CIC) remains an important issue when the Skipper CCD is configured to provide a large full-well capacity. We achieve a CIC rate of <1.45 × 10−3 e− pixel−1 frame−1 for a full-well capacity of ∼900 e−, which increases to a CIC rate of ∼3 e− pixel−1 frame−1 for full-well capacities ∼40,000–65,000 e−. We also perform conventional CCD characterization measurements such as charge transfer inefficiency (3.44 × 10−7 on average), dark current (∼2 × 10−4 e− pixel−1 s−1), photon transfer curves, cosmetic defects (<0.45% “bad” pixels), and charge diffusion (point-spread function < 7.5 μm) to verify that these properties are consistent with expectations from conventional p-channel CCDs used for astronomy. Furthermore, we provide the first measurements of the brighter-fatter effect and absolute quantum efficiency (≳80% between 450 and 980 nm; ≳90% between 600 and 900 nm) using Skipper CCDs.

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Postirradiation behavior of p-channel charge-coupled devices irradiated at 153 K

Cited by 5 publications

References 29 publications

Simplified charge transfer inefficiency correction in CCDs by trap-pumping

Simplified charge transfer inefficiency correction in CCDs by trap-pumping

Charge transfer efficiency in a p-channel CCD irradiated cryogenically and the impact of room temperature annealing

Characterization and Optimization of Skipper CCDs for the SOAR Integral Field Spectrograph

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