Post buckling analysis of silicon microneedle

Abstract

The microneedle is used to deliver the drug inside the skin structure. During the insertion procedure, the microneedle travel up to the dermis layer through the stratum corneum and epidermis layer. The microneedle have a tendency to critically buckle when the applied load achieves the maximum buckling load. To avoid structural failure of the microneedle, the critical load is identified and safely applied. In this paper, the critical buckling load is identified using the linear and non-linear buckling analysis. The critical load using linear buckling analysis is found to be 263.7µN. The non-linear or post -buckling analysis is performed for the load of 263.7µN and the critical load is found to be 149µN. Thus for silicon microneedle, the critical load is identified as 149µN. Henceforth for silicon microneedle, the applied load should always be smaller than the critical buckling load for safe insertion.