Possibility of measuring range extension of growing thin films thickness control, based on surface plasmon resonance effect

Komlev, А. Е.; Babinova, R V; Dyukin, R. V.

doi:10.1088/1757-899x/387/1/012039

IOP Conf. Ser.: Mater. Sci. Eng.

2018

DOI: 10.1088/1757-899x/387/1/012039

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Possibility of measuring range extension of growing thin films thickness control, based on surface plasmon resonance effect

А. Е. Komlev

R V Babinova

R. V. Dyukin

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Possibility of measuring range extension of growing thin films thickness control, based on surface plasmon resonance effect

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References 2 publications

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