Possibilities and Limitations of Combined Scanners

Abstract

The technique of optical scanning is continuously developing in the direction of creating new and improving existing types of scanners (deflectors), radiation sources, methods of reading, converting and reproducing information. However, the absence of universal scanner, able to satisfy different applications leads to necessity of application of combined scanning, finding the most effective combination of deflectors with complementary characteristics taking into account their limit values. The purpose of this work is an overview of a typical combined of the scanners used in the systems of wide application, analysis of existing experience in the use of combined deflectors. The article discusses the optical schemes of modern combined scanners, which include scanners of different operating principles and design. The analysis of combined devices for various applications is given, which included optical-mechanical, electronic, acoustic-optical, electro-optical scanners, as well as micro-electromechanical (MEMS) systems, expanding the sphere of scanning tools. The consideration was conducted with a wide set of parameters and characteristics, such as speed, resolution, accuracy of the control of the optical beam, the size of the scanned space, etc. Identified features and benefits of the combined scanning for dynamic, precision, spectral, and structural characteristics and functionality, and also are noted difficulty in implementing a combined scanning. Among them are optical harmonization, dynamic, algorithmic and precision matching of scanners integrated into the device.

Method for Calculating the Scanning Unit of a Laser Scanner and Optimizing Its Overall Dimensions

“…Актуальность создания сканирующих устройств, построенных на базе нескольких сканирующих элементов, обозначена в работе [16]. В работе [17] приведен анализ комбинированных устройств, в которые вошли оптикомеханические, электронные, акустооптические, электрооптические сканаторы, а также микроэлектромеханические (MEMS) системы с учетом широкого набора параметров и характеристик, таких как быстродействие, разрешение, точность управления оптическим пучком, размеры сканируемого пространства и др.…”