2016
DOI: 10.2494/photopolymer.29.509
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Positive Tone Nanoparticle Photoresists: New Insight on the Patterning Mechanism

Abstract: Methacrylate based nanoparticle materials have been investigated for their negative-tone patterning with DUV (248nm, 254nm), e-beam and EUV lithography, and show promising EUV sensitivity and resolution. In order to further extend the application of this novel class of materials and understand more about the underlying mechanism, we continue to study its dual-tone behavior and the tone-switching process. Catalyzed by a photoradical generator, we have been able to print positive tone line-space patterns with bo… Show more

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Cited by 8 publications
(7 citation statements)
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References 14 publications
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“…The authors demonstrated that by using Hg–Xe lamp lithography, microscale (100 µm line width) TiO 2 and ITO patterns could be obtained (Figure c). Ober and co‐workers at Cornell investigated the dual‐tone behavior of MO nanoparticle resists and showed the feasibility of using the Zr methacrylate (ZrMAA) nanoparticle resist as a positive tone resist . By changing the developer to TMAH and adding an additional postexposure baking (PEB) step, positive tone resist behavior was observed in the MO precursors.…”
Section: Mo Patterns Made By Solution Direct‐patterning Techniquesmentioning
confidence: 99%
“…The authors demonstrated that by using Hg–Xe lamp lithography, microscale (100 µm line width) TiO 2 and ITO patterns could be obtained (Figure c). Ober and co‐workers at Cornell investigated the dual‐tone behavior of MO nanoparticle resists and showed the feasibility of using the Zr methacrylate (ZrMAA) nanoparticle resist as a positive tone resist . By changing the developer to TMAH and adding an additional postexposure baking (PEB) step, positive tone resist behavior was observed in the MO precursors.…”
Section: Mo Patterns Made By Solution Direct‐patterning Techniquesmentioning
confidence: 99%
“…However, these films still contain ∼40% carbon following exposure to a dose that results in the solubility transition. Previous studies have suggested that the excess carbon is removed from organotin photoresists due to the thermal energy provided during the PEB . Because the PEB is typically performed under atmospheric conditions, the O 2 and/or H 2 O present in air could assist in desorption of the organic ligands or the formation of Sn–O–Sn network bonds.…”
Section: Resultsmentioning
confidence: 99%
“…An alkali-soluble type PISC2 can be patterned by alkali-developer after UV exposure and baking in the same manner as positive tone photoresists [15][16][17]. Figure 7 shows SEM images of patterns of PISC-X007 with various film thicknesses, resolutions and shapes.…”
Section: Formation Of Repellent Template Patternsmentioning
confidence: 99%