Position sensitive X-ray detectors

Hendrix, J.

doi:10.1007/bfb0016606

Cited by 11 publications

References 35 publications

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X‐Ray Diffraction by Polymers

Roe

2015

Encyclopedia of Polymer Science and Technology

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This article introduces X‐ray diffraction (XRD) techniques as applicable to structural characterization of macromolecules. General XRD principles and instrumentation are presented. Special attention is put on the analysis of small‐ and wide‐angle scattering data of polymers forming crystalline or amorphous structures. For each type of XRD experiment and specimen type (eg, powder, fiber, thin film, and dispersed particles) representative data analysis are presented including, for example, crystallite size and orientation, polymer chain conformation, and density fluctuations.

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X‐Ray Diffraction by Polymers

Roe

2015

Encyclopedia of Polymer Science and Technology

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Small angle X‐ray scattering pole figures of semicrystalline polymers obtained by synchrotron radiation

Röber

Bösecke

Zachmann

1988

Makromolekulare Chemie. Macromolecular Symposia

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A goniometer for measuring small angle X‐ray scattering pole figures by using synchrotron radiation has been constructed. In order to obtain the scattering in a large range of scattering angles, position‐sensitive detectors (Gabriel counter and vidicon system) are applied. The integrated intensity as well as the position and the half width of the maximum are determined as functions of the angle between the incident beam and the normal to the film surface of the sample. The time necessary to determine a pole figure was approximately 3 hours. Samples of poly(ethylene terephthalate) were drawn under different conditions: uniaxially and biaxially at 92°C under homogeneous deformation, and uniaxially at 40°C by necking. The influence of the drawing conditions on the orientation of the crystal lamellae was determined. The results of the small angle scattering are compared with pole figures obtained by wide angle scattering. In addition some results with polypropylene were obtained. The small angle X‐ray scattering is strongly affected by the limited size of the crystals and by the incomplete regular arrangement of the crystals. This gives rise to difficulties in the interpretation of the results. The problem will be discussed.

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