Polymer Morphology 2016
DOI: 10.1002/9781118892756.ch17
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Polymer Surface Topography and Nanomechanical Mapping

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Cited by 2 publications
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“…27,28 Atomic Force Microscopy (AFM) is a widely used technique to study different surfaces including polymers and to obtain their topography maps. 29,30 The self-assembly oen leads to multiscale or hierarchical surface features (i.e., with small-scale roughness imposed on large-scale roughness), to self-affine or even to self-similar (fractal) structures. Note that self-similar and hierarchical structures are not the same.…”
Section: Introductionmentioning
confidence: 99%
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“…27,28 Atomic Force Microscopy (AFM) is a widely used technique to study different surfaces including polymers and to obtain their topography maps. 29,30 The self-assembly oen leads to multiscale or hierarchical surface features (i.e., with small-scale roughness imposed on large-scale roughness), to self-affine or even to self-similar (fractal) structures. Note that self-similar and hierarchical structures are not the same.…”
Section: Introductionmentioning
confidence: 99%
“…27,28 Atomic Force Microscopy (AFM) is a widely used technique to study different surfaces including polymers and to obtain their topography maps. 29,30…”
Section: Introductionmentioning
confidence: 99%