2002
DOI: 10.1016/s0379-6779(01)00644-0
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Polymer gratings achieved by focused ion beam

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Cited by 23 publications
(15 citation statements)
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“…Secondary Ion Mass Spectrometry (SIMS) studies revealed that hydrogen is expelled in large quantity and is the first molecular fragment driven out from the sample surface. [2] According to the literature, [10] the C-C bonds in the backbone as well as the C-C and the C-O bonds in the methacrylate side group are susceptible to cleavage by ions. Bond cleavage in the side groups produces small mobile fragments while broken bonds in the backbone chain will result in large immobile sections of the macromolecule with some trend to recombination of the radical states, at least at low Ga + ion currents.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…Secondary Ion Mass Spectrometry (SIMS) studies revealed that hydrogen is expelled in large quantity and is the first molecular fragment driven out from the sample surface. [2] According to the literature, [10] the C-C bonds in the backbone as well as the C-C and the C-O bonds in the methacrylate side group are susceptible to cleavage by ions. Bond cleavage in the side groups produces small mobile fragments while broken bonds in the backbone chain will result in large immobile sections of the macromolecule with some trend to recombination of the radical states, at least at low Ga + ion currents.…”
Section: Resultsmentioning
confidence: 99%
“…[2,3] For example, some of the underlying mechanisms may vary significantly for high and low ion beam irradiation. It has also been reported that the introduction of water vapour to the surface of polymer samples during FIB milling provides a significant increase in the milling yield of polymers.…”
Section: Introductionmentioning
confidence: 99%
“…Cho et al [169] employed ion assisted reactions (IAR) to modify the surface of polymeric materials to manipulate the wettability characteristics, enhancing their hydrophilic nature. In addition, Aubry et al [170], used a focused ion beam (FIB) to generate surface topographies that had a high enough resolution for applications in diffractive optical elements (DOEs). Furthermore, through the application of FIB, it has been shown that ripple patterns can be formed on polymeric materials (see Figure 9), a surface similar to that seen with the application of femtosecond laser processing (see Figure 4).…”
Section: Ion Beam and Electron Beam Processingmentioning
confidence: 99%
“…Poly(methylmethacrylate), PMMA, a well-known electron beam resist, 18 is interesting in this regard due to its unusually high ion-beam sputtering yield, allowing facile creation of polymer gratings, 19 masters for high-resolution elastomer molding, 20 and patterned resists for anodic alumina etching. 21 Our interest in controlling molecular transport within submicrometer-sized structures led us to pursue FIB milling through thin films of PMMA as a route to the fabrication of individual submicrometer channels, because they exhibit large aspect ratios and the fabrication control necessary to create spatially defined arrays of submicrometer channels.…”
Section: Fabrication Of Single Nanofluidic Channels In Poly(methylmetmentioning
confidence: 99%