1989
DOI: 10.1021/ma00196a026
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Polymer concentration profile near a liquid-solid interface: evanescent wave ellipsometry study

Abstract: The phase retardation angle, ~~. as a function of the incident angle was measured to study adsorption and depletion of polymers near a solid substrate from a solution by use of an evanescent wave ellipsometry technique. A lightly sulfonated ionomer dissolved in a polar solvent displayed an appreciable interfacial adsorption layer, while the nonionic precursor in ethyl acetate exhibits a depleted concentration profile. The results are in good agreement with adsorption or depletion layer profiles obtained previo… Show more

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Cited by 21 publications
(10 citation statements)
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“…Their results agreed best with the expected concentration profile of a semiflexible chain . Evanescent wave ellipsometry has also been used to study polymer depletion layers near surfaces, yielding a thickness of 7.0 nm for PS of molecular weight 100 000 dissolved in ethyl acetate …”
Section: Discussionsupporting
confidence: 59%
“…Their results agreed best with the expected concentration profile of a semiflexible chain . Evanescent wave ellipsometry has also been used to study polymer depletion layers near surfaces, yielding a thickness of 7.0 nm for PS of molecular weight 100 000 dissolved in ethyl acetate …”
Section: Discussionsupporting
confidence: 59%
“…This rule applies at c=45.OO degrees and P greater than but near 45.00 degrees (first zone) . choose sign of Cof the other zones to assure approximately the same value of lIas (9) in the first zone.…”
Section: Eomentioning
confidence: 99%
“…Using single reflection evanescent wave ellipsometry, Kim et al [10] studied polymer concentration profile near a liquid-solid interface, but they did not use waveguide. Waveguide sensors can employ more active area and are more sensitive than single reflection evanescent wave ellipsometry.…”
Section: Introductionmentioning
confidence: 99%