Polymer Characterization with the Atomic Force Microscope

Maver, Uroš; Maver, Tina; Peršin, Zdenka; Mozetič, Miran; Vesel, Alenka; Gaberšček, Miran; Stana‐Kleinschek, Karin

doi:10.5772/51060

Cited by 16 publications

(17 citation statements)

References 51 publications

(50 reference statements)

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“…This can be advanced by functionalising end of the tip with specific molecules to measure the specific binding strength between molecules [60] which results in an image of the distribution of functional chemical groups [51].…”

Section: Force Spectroscopymentioning

confidence: 99%

“…The AFM is, however, not limited to topographic images; it can also be used to identify and discriminate surfaces with varying chemical properties, for example, by modifying the AFM tip with self-assembled monolayers (SAMs) of specific functional groups [60]. The method of scanning surfaces with modified AFM probes is called chemical force microscopy (CFM) [60,71]. Chemical force microscopy detects the chemical interaction between the functionalised tip and the surface and maps it as a 3D image, similar to the image of surface morphology and often both images can be acquired simultaneously [1,32,55,76].…”

Section: The Atomic Force Microscopementioning

confidence: 99%

“…As elaborated by Starostina and West [88] and Prater et al [76], the AFM is capable of producing 3D topographical information from the Å to the lm level with high resolution. The AFM is, however, not limited to topographic images; it can also be used to identify and discriminate surfaces with varying chemical properties, for example, by modifying the AFM tip with self-assembled monolayers (SAMs) of specific functional groups [60]. The method of scanning surfaces with modified AFM probes is called chemical force microscopy (CFM) [60,71].…”

Section: The Atomic Force Microscopementioning

confidence: 99%

“…The forces acting on the cantilever are measured via a laser beam that is reflected off the cantilever into a photodiode and any change in its position is counteracted by feedback control system that maintains the desired force between the probe and the sample by moving a piezo element in z direction [1,26,32,55]. The force detected between the probe and the surface can be as small as 1 nN [60,88]. Recently, an AFM-based technique where forces up to 1 mN can be applied to fibre samples has been proposed by Schmied et al [83].…”

Section: The Atomic Force Microscopementioning

confidence: 99%

“…Force spectroscopy is used to determine the interaction between the probe and the sample with nN resolution and provides valuable information on molecular scale with regard to the adhesion force between tip and sample [51,60,76].…”

Section: Force Spectroscopymentioning

confidence: 99%

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Characterisation of the Interfacial Adhesion of the Different Components in Wood–Plastic Composites with AFM

Effah

Reenen

Meincken

2015

Springer Science Reviews

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The search for innovative solutions for the reuse of solid residues has intensified with growing environmental issues and the increasing cost of most raw materials, leading to the design of eco-friendly composite materials, such as wood-plastic composites (WPCs). These materials combine the stability of wood fibres with the durability of plastic, allowing for a wide range of applications, whilst simultaneously offering the possibility of utilising waste products from the forest/wood industry and recycled plastic. Waste products that otherwise incur cost for disposal therefore become a sustainable material resource for new products. Natural fibres offer a number of advantages over synthetic fibres and are seen as a ''green'' alternative to other reinforcements. Commonly, the fibrematrix adhesion in WPCs is improved by using compatibilisers that bond to the polar wood fibres and the non-polar polymer matrix. However, the problem with these is that good dispersion is not always achieved as it depends on the adhesion properties of three individual components in the WPC, which might lead to poor mechanical properties of the WPC. The ability of the atomic force microscope (AFM) to create 3D images of topography and various interaction forces with molecular resolution made it a valuable tool for the analysis of adhesion properties in WPCs.

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Section: Force Spectroscopymentioning

confidence: 99%

Section: The Atomic Force Microscopementioning

confidence: 99%

Section: The Atomic Force Microscopementioning

confidence: 99%

Section: The Atomic Force Microscopementioning

confidence: 99%

Section: Force Spectroscopymentioning

confidence: 99%

See 3 more Smart Citations

Characterisation of the Interfacial Adhesion of the Different Components in Wood–Plastic Composites with AFM

Effah

Reenen

Meincken

2015

Springer Science Reviews

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Characterization of Polymer Materials

2022

Polymer Nanocomposites for Energy Applications

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Atomic force microscopy and scanning electron microscopy characterization of the controlling of surface morphology of epoxy‐amine‐cured spin‐coated films

Shenk,

Benjamin,

Winter

2023

J of Applied Polymer Sci

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Atomic force microscopy (AFM) was successfully used to study spin‐coated, amine‐cured epoxy film microstructure and morphology. The air‐epoxy and epoxy‐substrate interfaces were examined using tapping‐mode height and phase imaging AFM. The impact of relative humidity on the morphology and microstructure of the surfaces was determined. AFM was able to elucidate the changes on the surface as relative humidity during processing increased. It was observed that large nodular formations formed on the epoxy surface expose to the air but not epoxy surface formed on the substrate in addition to varying regions of more or less compliant structures, which was attributed to carbamate formation caused by the amine curing agent reaction with atmospheric CO2. Scanning electron microscopy (SEM) was used to further elucidate interface and interphase morphology of spin‐coated epoxies. Experimentation also demonstrated that post‐curing above the glass transition did not change the morphology structure, suggesting surface structures are “locked‐in.” SEM was used to further elucidate how the interface and interphase change with changing environmental conditions at both the air‐epoxy and epoxy‐substrate interface/interphases, including the impact of atmospheric CO2 on Marangoni cell formation.

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Polymer Characterization with the Atomic Force Microscope

Cited by 16 publications

References 51 publications

Characterisation of the Interfacial Adhesion of the Different Components in Wood–Plastic Composites with AFM

Characterisation of the Interfacial Adhesion of the Different Components in Wood–Plastic Composites with AFM

Characterization of Polymer Materials

Atomic force microscopy and scanning electron microscopy characterization of the controlling of surface morphology of epoxy‐amine‐cured spin‐coated films

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