Polarizing triangular cyclic interferometer for characterizing optical samples with birefringent properties

Kaewon, Rapeepan; Pawong, Chutchai; Bhatranand, Apichai; Chitaree, Ratchapak

doi:10.1117/12.2195890

Cited by 3 publications

(2 citation statements)

References 5 publications

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“…The sample placed in the common path of the interferometer as in [10,16] may not be optically flat or causes surface anomalies, therefore, the sample can be placed before or after interferometer system as reported in [17]. As depicted in figure 2, the sample is placed in one arm at the output for real-time measurement.…”

Section: Phase Retardation With Presence Of Samplesmentioning

confidence: 99%

“…where α= (δ 2x (t) + δ 1x ) and β = δ 2y (t) + δ 1y + ∆ S . The phase retardation, ∆ S for three-, four-and five-stepping algorithms [16,19] can be found as equations ( 13)- (15), respectively. Consequently, the thickness d of Ta 2 O 5 and WO 3 thin films deposited on BK-7 substrate can be evaluated as…”

Section: Phase Retardation With Presence Of Samplesmentioning

confidence: 99%

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The comparison of multi-stepping algorithms for real-time thickness measurement of transparent thin films using polarization settings

Usman¹,

Jiraraksopakun²,

Kaewon³

et al. 2022

Laser Phys.

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This paper presents the comparison of three-, four- and five-step techniques for measuring transparent thin-film thickness of T a 2 O 5 and W O 3 deposited on BK-7 substrates. The Sagnac interferometer was modified with phase shifting approach for the determination of thin-film thickness. The input light beam was split into reference and testing beams. Before the output light reaching the balanced photodetectors, the real-time signal detection was performed to obtain the output intensities of both beams using three-, four-, and five-polarization settings of an analyzer. The thicknesses could then be efficiently translated from the measured intensities. Thicknesses from three-, four- and five-stepping algorithms were compared with ones from the conventional FE-SEM measurement, and it was discovered that the former performed better with less errors. The findings show that the phase-shifting technique using three-polarization settings is more suitable for the thickness measurement of the transparent thin film.

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Section: Phase Retardation With Presence Of Samplesmentioning

confidence: 99%

Section: Phase Retardation With Presence Of Samplesmentioning

confidence: 99%

The comparison of multi-stepping algorithms for real-time thickness measurement of transparent thin films using polarization settings

Usman¹,

Jiraraksopakun²,

Kaewon³

et al. 2022

Laser Phys.

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Measurement of phase retardation in a liquid crystal variable wave retarder using a polarizing triangular interferometer

Pawong

Kaewon

Chitaree

et al. 2016

2016 15th International Conference on Optical Communications and Networks (ICOCN)

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Quantitative birefringence microscopy with collinearly propagating orthogonally polarized beams

2018

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Full-field evaluation of spatially varying birefringence is realized by allowing two mutually orthogonally polarized collinearly propagating laser beams to be incident on a birefringent sample. This is achieved by use of a modified Sagnac interferometer. A half-wave plate is placed in the exit path of the interferometer to adjust the polarizations of the incident beams as required. Amplitude components of the light emerging from the birefringent object are then selected and/or combined by a polarizer, and intensities for required orientation of the half-wave plate and the analyzer are digitally recorded. It is shown that a maximum of four frames of intensity data is sufficient for complete evaluation of birefringence. The proposed technique is aimed towards birefringence measurements in microscopic biological specimens where the magnitude of retardation lies in the range of 0-π radians. Simulated and experimental results are presented.

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Polarizing triangular cyclic interferometer for characterizing optical samples with birefringent properties

Cited by 3 publications

References 5 publications

The comparison of multi-stepping algorithms for real-time thickness measurement of transparent thin films using polarization settings

The comparison of multi-stepping algorithms for real-time thickness measurement of transparent thin films using polarization settings

Measurement of phase retardation in a liquid crystal variable wave retarder using a polarizing triangular interferometer

Quantitative birefringence microscopy with collinearly propagating orthogonally polarized beams

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