2000
DOI: 10.1016/s0368-2048(00)00168-7
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Polarized resonant inelastic X-ray scattering from single-crystal transition metal oxides

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Cited by 35 publications
(34 citation statements)
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“…In principle, d → d excitations provide a testing ground for the validity of conventional Raman selection rules within RIXS, and such excitations have been well studied with soft X-ray RIXS at the Cu L- [8][9][10]40,41 and M-edges, 11 with optical absorption, 42 with large-shift Raman scattering, 43 and with different theoretical methods. 44,45 Although for Nd 2 CuO 4 only the A 2g (d x 2 −y 2 → d xy ) Cu crystal-field excitation has been observed around 1.4 eV, 43 the crystal-field excitations of tetragonal Sr 2 CuO 2 Cl 2 have been extensively studied 10,11,42,44 and their energies should be similar to those of Nd 2 CuO 4 .…”
Section: Discussionmentioning
confidence: 99%
“…In principle, d → d excitations provide a testing ground for the validity of conventional Raman selection rules within RIXS, and such excitations have been well studied with soft X-ray RIXS at the Cu L- [8][9][10]40,41 and M-edges, 11 with optical absorption, 42 with large-shift Raman scattering, 43 and with different theoretical methods. 44,45 Although for Nd 2 CuO 4 only the A 2g (d x 2 −y 2 → d xy ) Cu crystal-field excitation has been observed around 1.4 eV, 43 the crystal-field excitations of tetragonal Sr 2 CuO 2 Cl 2 have been extensively studied 10,11,42,44 and their energies should be similar to those of Nd 2 CuO 4 .…”
Section: Discussionmentioning
confidence: 99%
“…Particular energy loss features, as indicated by the gray lines, were enhanced at particular resonant energies, leading to very different lineshape. These energy loss features are signatures of dd-excitations 36 , details on which is not the topic of this paper. With better resolution, our RIXS data revealed more excitation modes than that in previous publications, covering the whole range of the optic absorption bands 37 .…”
Section: Xas and Rixs Measurementsmentioning
confidence: 98%
“…The dispersionless behavior of the band edge intensity is not consistent with a coherent resonant inelastic X-ray scattering (RIXS) process in which the two-photon excitation and decay process is coupled to a lower-energy electronic transition. 57 Instead, it could represent a shake-up process in which valence electron excitations are stimulated during the relaxation of a core-level electron promoted by an X-ray photon to a state above the top of the CB. In this picture, the excess XES intensity is caused by normal fluorescence transitions from the excited states.…”
Section: Band Gap Measurements In Transition Metal Oxides By Soft-x-rmentioning
confidence: 99%