Profile line deconvolution following a Rietveld approach is applied to Raman spectra obtained from natural zircon grains from the European Alps. The corrected bandwidths are in perfect agreement with the values obtained from an established correction method (after Irmer) as far as the area of validity of the latter is concerned. For Raman active modes smaller than that, the Rietveld approach also yields accurate values for the true Raman bandwidth. Moreover, changes to instrument parameters are compensated by the correction routine. As for the studied zircon grains, Raman spectroscopy was shown to be a suitable tool for the examination of zoning (i.e. regions which show a variable degree of radiation-induced damage because of a different amount of incorporated uranium and/or thorium). This is complicated by the fact that the measured Raman signal is not restricted to the depth expected from the axial resolution (several micrometers) but a significant contribution comes from a comparatively large excitation volume (tens of micrometer deep). This sampling volume, however, lies within the same order of magnitude as zoning, which itself is blurred by the range of amorphization-causing alpha-particles.