Polarized NEXAFS studies on the mechanical rubbing effect of poly(tetrafluoroethylene) oligomer and its model compound

Nagayama, K; Sei, M.; Mitsumoto, R.; Ito, Eisuke; Araki, Tohru; Ishii, Hisao; Ouchi, Yukio; Seki, Kazuhiko; Kondo, K.

doi:10.1016/s0368-2048(96)80102-2

Cited by 18 publications

(15 citation statements)

References 8 publications

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“…On the other hand, the spectra of PET film and TPA powder showed little θ-dependence. A high degree of orientation in evaporated films of molecular materials has also been observed for other compounds such as alkanes, perfluoroalkanes, , and aromatic hydrocarbons . We note that simple spin-coating of PBT still gave a reasonably oriented film.…”

Section: Resultssupporting

confidence: 72%

“…Second, the specimens of these molecules can be often prepared with much better degree of orientation than the oriented polymeric specimens, which are prepared by techniques such as elongation or surface rubbing. We have demonstrated this point for various polymers such as polyethylene, poly(tetrafluoroethylene), , and poly( p -phenylene) …”

Section: Introductionmentioning

confidence: 81%

“…Near edge X-ray absorption fine structure (NEXAFS) spectroscopy, also known as X-ray absorption near edge structure (XANES) spectroscopy, is a recently developed branch of X-ray spectroscopy, which is useful as a new tool of basic studies on material characterization and also as an analytical technique for chemical specification . For polymers, NEXAFS offers information about the identification of the polymeric chain and the functional groups, their orientation, and also the unoccupied electronic structures both in the bulk and at the surface. − Also the characterization of polymers using NEXAFS in the field of micro-NEXAFS and organic reaction is rapidly growing. − In these studies, it is critically important to make correct interpretation of the spectra of fundamental polymers, since they form the basis for interpreting the spectra of more complex polymers.…”

Section: Introductionmentioning

confidence: 99%

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Polarized NEXAFS Spectroscopic Studies of Poly(butylene terephthalate), Poly(ethylene terephthalate), and Their Model Compounds

Okajima¹,

Teramoto²,

Mitsumoto³

et al. 1998

J. Phys. Chem. A

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Near edge X-ray absorption fine structure (NEXAFS) spectra were obtained using total electron yield detection for poly(butylene terephthalate) (PBT) and poly(ethylene terephthalate) (PET) and their model compounds 4,4′-biphenyldicarboxylic acid dimethyl ester (PAM), 4,4′-biphenyldicarboxylic acid (PCA), and terephthalic acid (TPA). The spectra of PBT and PET were interpreted with the comparison of the spectral features of model molecules and the polarized NEXAFS spectra of oriented films of PAM, PCA, and PBT. From the polarization dependence, the peaks previously ascribed to a C 1s f π*(ring) or π*(ring/CdO) excitation at 289.8 eV and an O 1s f 3p/Rydberg or f π*(CdO) transition at 536.4 eV were reassigned to a C 1s f σ*(O-CH x ) transition and an O 1s f σ*(O-CH x ) transition, respectively. The present results demonstrate that the polarization dependence of the NEXAFS spectra of oriented small analogous molecules are useful for the assignment of the NEXAFS spectra of polymers.

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Section: Resultssupporting

confidence: 72%

Section: Introductionmentioning

confidence: 81%

Section: Introductionmentioning

confidence: 99%

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Polarized NEXAFS Spectroscopic Studies of Poly(butylene terephthalate), Poly(ethylene terephthalate), and Their Model Compounds

Okajima¹,

Teramoto²,

Mitsumoto³

et al. 1998

J. Phys. Chem. A

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“…Nagayama et al . studied mechanical rubbing effects on PTFE using NEXAFS . In the present study, the effects of annealing on the molecular orientation in PTFE thin films were studied by F K ‐edge NEXAFS spectroscopy.…”

Section: Introductionsupporting

confidence: 88%

“…The polarization dependence of NEXAFS spectra for the carbon and fluorine K-edge regions of PTFE at room temperature has previously been measured and peak assignments were proposed [9] . Nagayama et al studied mechanical rubbing effects on PTFE using NEXAFS [10,11] . In the present study, the effects of annealing on the molecular orientation in PTFE thin films were studied by F K-edge NEXAFS spectroscopy.…”

Section: Introductionmentioning

confidence: 99%

Effects of annealing on the molecular orientation in polytetrafluoroethylene thin films

Kobayashi¹,

Okudaira

Okajima³

2012

Surface & Interface Analysis

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aThe effects of annealing on the molecular orientation in polytetrafluoroethylene (PTFE) thin films evaporated on copper and silicon plates were studied using F K-edge near-edge X-ray absorption fine structure (NEXAFS) spectroscopy. The intensity of the F 1 s ! s*(C-F) transition in the NEXAFS spectrum from a non-annealed PTFE thin film on a copper plate at a glancing X-ray incidence angle was stronger than that at the normal incidence angle. For a thin film annealed at~250 C in a nitrogen atmosphere, the s*(C-F) peak intensity at the glancing angle was weaker than that at a normal angle. The F K-edge NEXAFS spectra of a thin film annealed at~350 C showed a weakening dependence on the X-ray incidence angle. This result indicates that the molecules in a PTFE thin film are increasingly oriented normal to the substrate surface with increasing annealing temperature and are oriented randomly.

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X‐ray Microscopy

Ade

2002

Encyclopedia of Polymer Science and Technology

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During the last few years near edge x‐ray absorption fine structure (nexafs) spectroscopy/microscopy has evolved into a useful characterization tool for polymer science, providing quantitative compositional mapping with minimal radiation damage at a spatial resolution of presently about 40 nm. This article reviews the spectroscopic principles of nexafs, discusses some polymer nexafs reference spectra to illustrate the underlying utility of nexafs spectroscopy to nexafs microscopy, and provides an overview of the state‐of‐the‐art of x‐ray microscopy instrumentation. Applications of nexafs microscopy are wide ranging and include mapping the composition of polymer thin films and their surfaces, as well as the composition of ultrathin sections of bulk materials ranging from polymer blends to multilayers. To date, nexafs microscopy is still a specialized technique that requires powerful synchrotron radiation sources, similar to established polymer science tools such as neutron and x‐ray small‐angle scattering and reflectivity.

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Polarized NEXAFS studies on the mechanical rubbing effect of poly(tetrafluoroethylene) oligomer and its model compound

Cited by 18 publications

References 8 publications

Polarized NEXAFS Spectroscopic Studies of Poly(butylene terephthalate), Poly(ethylene terephthalate), and Their Model Compounds

Polarized NEXAFS Spectroscopic Studies of Poly(butylene terephthalate), Poly(ethylene terephthalate), and Their Model Compounds

Effects of annealing on the molecular orientation in polytetrafluoroethylene thin films

X‐ray Microscopy

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