2008
DOI: 10.1109/tmag.2008.924538
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Polarized Neutron Reflectometry for the Analysis of Nanomagnetic Systems

Abstract: In recent years, polarized neutron reflectometry (PNR) has played an essential role for the exploration of magneto-and spintronic structures. Well known systems extensively studied include exchange coupled magnetic superlattices, exchange bias systems between ferromagnetic and antiferromagnetic films, exchange spring valves between soft and hard magnetic films, and more recently magnetic semiconductors and ferromagnetic Heusler alloy films and superlattices. In addition to studies of laterally extended layered… Show more

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Cited by 26 publications
(15 citation statements)
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“…The important technical aspects of our PNR experiment are described below, while the details of methodology can be found elsewhere 28,29 . Neutron reflectometry experiments were performed at the instruments D17 30 (ILL, Grenoble, France) and BL17 SHARAKU 31 (J-PARC MLF, Tokai, Japan) in polarized time-of-flight mode.…”
Section: Methodsmentioning
confidence: 99%
“…The important technical aspects of our PNR experiment are described below, while the details of methodology can be found elsewhere 28,29 . Neutron reflectometry experiments were performed at the instruments D17 30 (ILL, Grenoble, France) and BL17 SHARAKU 31 (J-PARC MLF, Tokai, Japan) in polarized time-of-flight mode.…”
Section: Methodsmentioning
confidence: 99%
“…Careful fitting to the two obtained reflectivity curves in PNR allows the extraction of depth dependent magnetization and structure. PNR is widely employed in the successful characterization of spintronic materials [24] and is particularly useful in this study due to the large SLD contrast between the Ni and Bi layers. The sample is annealed repeatedly at 70 • C. Films are loaded at room temperature and cooled in an 0.2 T field to 10 K where we perform PNR measurements.…”
Section: Polarized Neutron Reflectometry Measurementsmentioning
confidence: 99%
“…Additionally, magnetic force microscopy is frequently used for determining the properties of magnetic NPs assembled on a surface [ 29 , 36 , 39 ]. In recent years, neutron reflectometry and small angle neutron scattering (SANS) have proven to be indispensable methods for characterizing the spin configurations of these nanoparticle systems in detail, with nanometer-scale resolution [ 40 , 41 , 42 , 43 , 44 , 45 , 46 , 47 , 48 ].…”
Section: Introductionmentioning
confidence: 99%