Polarization properties of few-layer graphene on silicon substrate in terahertz frequency range

Abstract

Terahertz time-domain spectroscopic polarimetry (THz-TDSP) method was used to study polarization properties of a few-layer graphene (FLG) on a silicon (Si) substrate in terahertz (THz) frequency range under an external optical pumping and an external static magnetic field. Frequency dependencies of azimuth and ellipticity angles of a polarization ellipse and the polarization ellipse at various frequencies of the electromagnetic waves transmitted through the Si substrate and the FLG on the Si substrate were obtained experimentally and theoretically. The results confirm the fact that, based on the FLG, it is possible to devise efficient tunable THz polarization modulators for use in the latest security and telecommunication systems.