Polarization modulation spectroscopy of surface plasmon resonance

Berezhinsky, L. J.; Максименко, Л. С.; Matyash, I. E.; Руденко, С. П.; Сердега, Б. К.

doi:10.1134/s0030400x08080146

Cited by 22 publications

(9 citation statements)

References 7 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Then computer simulation of the parameter ρ(θ) should be made. The reason for doing so is that, as was shown by us in [25] for the case of a film with thickness d = 50 nm, the equation obtained using the Fresnel formulae for a three-layer glass-metal film-air system is in excellent agreement with the experimental data.…”

Section: Resultsmentioning

confidence: 60%

“…A substantial reason for this is application of the measuring analytical procedure based on modulation of electromagnetic radiation polarization-the so-called polarization modulation (PM) technique. Its advantage for investigation of SPR was demonstrated in our work [25] and later in a number of works generalized in [26].…”

Section: Introductionmentioning

confidence: 67%

“…The measuring role of PM technique whose functioning features were presented in detail in [25] is, first of all, separation of medium responses into the effects from polarized and non-polarized light components. The latter one (that is present practically always) is not related to the anisotropic properties of the matter under investigation.…”

Section: Methodsmentioning

confidence: 99%

See 2 more Smart Citations

Spectra of Plasmon Polaritons at Metal―Insulator Interfaces of a Nanosized Gold Film: Expansion into Components and Their Systematization

Maksimenko¹,

Matyash²,

Mischuk³

et al. 2014

JMP

View full text Add to dashboard Cite

The spectral characteristics of surface plasmon resonance (SPR) in nanosized gold films were studied with method of internal reflection in the Kretschmann geometry. Using modulation polarimetry technique, we measured the spectral and angular characteristics of the parameter 2 2 fering in frequency and amplitude) is shown. The resonance parameters are determined and used for construction of dispersion curves ( ) k ω . Their interpretation is given based on the theoretical model for waveguide modes on both metal film surfaces that were proposed earlier.

show abstract

Section: Resultsmentioning

confidence: 60%

Section: Introductionmentioning

confidence: 67%

See 1 more Smart Citation

Spectra of Plasmon Polaritons at Metal―Insulator Interfaces of a Nanosized Gold Film: Expansion into Components and Their Systematization

Maksimenko¹,

Matyash²,

Mischuk³

et al. 2014

JMP

View full text Add to dashboard Cite

show abstract

“…However, it can be reliably registered with the PM technique owing to amplification. As has been shown earlier [11], application of PM for investigation of the features of total internal reflection attenuated with gold films made it possible to separate the PPR characteristics against the background of two nonresonance components. This fact gives grounds to use the PM technique for investigation of cluster nanostructures as one more demonstrations of its detection abilities.…”

Section: Introductionmentioning

confidence: 85%

“…The optical unit of the installation for investigation of the PPR features was made in the Kretschmann geometry. (For its diagram as well as detailed description of the processes of modulation of radiation polarization and signal registration, see [11].) Modulation of polarization was made with the most appropriate facility based on the photoelastic effect [13].…”

Section: The Samples and Experimental Proceduresmentioning

confidence: 99%

The features of surface plasmon resonance in gold cluster films

Максименко¹

2009

Semicond. phys. quantum electron. optoelectron.

Self Cite

View full text Add to dashboard Cite

The internal reflection of nanosized gold cluster films was studied using the technique of polarization modulation of electromagnetic radiation in the Kretschmann geometry. We measured the reflection coefficients R s and R p of sand p-polarized radiation, respectively, as well as their polarization difference ∆R = R s − R p , as function of the light incidence angle in the 0.4÷1.6 µm wavelength range. A topological size effect was found; it consists in dependence of the value and sign of curvature of the polarization difference characteristics on the film surface properties. It is shown that the sign of curvature of ∆R characteristics depends on the radiation wavelength λ and indicates resonance interaction with a metal film of either p-polarized radiation only or that of both polarizations. The spectral characteristic of the topological size effect in the resonance interaction is obtained from the condition of isotropic reflection, ∆R = R s − R p = 0, and its dependence on the radiation wavelength.

show abstract