2008
DOI: 10.1364/ao.47.006422
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Polarization information for terahertz imaging

Abstract: A method to analyze the change in the polarization state of a terahertz (THz) wave by using a typical electro-optic sampling setup with a ?110? zinc-blende crystal as a sensor is presented. To illustrate knowledge of the polarization of the THz pulse, the THz detection function in a ZnTe crystal is presented. Two kinds of Jones matrix for the birefringence device and the polarizer device are used to analyze the polarization change in the THz electric field caused by the sample. It is found that THz polarizatio… Show more

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Cited by 34 publications
(19 citation statements)
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“…Since light is a transverse wave, polarization is a very important physical property that can provide more useful information about the targets [5,6]. Applying imaging approaches based on the degree of polarization of scattered light can distinguish the edges of objects more clearly and hence identify the target object with higher precision since more information can be obtained from the polarization state of the scattered light [7,8]. Zhang et al found that THz polarization imaging is sensitive to the edge of the sample [8].…”
Section: Introductionmentioning
confidence: 99%
“…Since light is a transverse wave, polarization is a very important physical property that can provide more useful information about the targets [5,6]. Applying imaging approaches based on the degree of polarization of scattered light can distinguish the edges of objects more clearly and hence identify the target object with higher precision since more information can be obtained from the polarization state of the scattered light [7,8]. Zhang et al found that THz polarization imaging is sensitive to the edge of the sample [8].…”
Section: Introductionmentioning
confidence: 99%
“…1b as a In order to present a practical application of the this measurement method, a cross dipole antenna coupled silicon FET detector is used for polarization imaging. Terahertz polarimetry [7] is selected as it applied widely to analyze birefringent materials [8], metamaterials, notnormal incidence reflection, and multiple scattering samples [9]. The used detector is manufactured in standard 180nm feature sized CMOS technology with 440nm drawn width and 330nm length.…”
mentioning
confidence: 99%
“…The rapidly growing demand for high performance terahertz imaging and spectroscopy systems necessitates the development of high quality terahertz polarizing beam splitters with high extinction ratios, large angular apertures, low attenuation, and broad frequency bandwidths [4][5][6]. Most optical polarizing beam splitter schemes based on natural birefringence effects or polarization selectivity of multilayer dielectric coatings do not operate efficiently at a broad range of terahertz frequencies [7-9], due to the lack of materials with the desired properties at terahertz frequencies and/or the practical difficulties in scaling device dimensions to efficiently operate at terahertz frequencies.…”
mentioning
confidence: 99%