Antenna coupled field effect transistor (FET) as plasma wave THz detector is used with current steering to record separately the gate-source, gate-drain photoresponse, and their phase sensitive combination. The method based on the observation that the plasmon-terminal coupling is cut-off in saturation resulting in only one side sensitivity. A polarimetric example is presented with intensity and polarization angle reconstruction using a single three terminal antenna coupled Si-MOSFET. The technique is applicable to various detection schemes and technologies (HEMT, GaAs-, GaN-, Si-MOSFETs) and other application possibilities are discussed. . Though other exotic approaches may provide better properties, in focal plane solutions, the commercial silicon technology is the common platform. Using optical elements and multiple detectors (e.g. two detector arms) complex properties can be measured beside absorption and reflection parameters, such as phase delay or polarization angle. The distinguishing feature of the introduced method is that a single antenna coupled FET detector is used to measured different radiation properties selected by means of simple electronic control. First, the FET plasma wave detection is revised briefly. In the conducting channel of a FET a 2D electron sheet is formed as a function of the gate potential. The high frequency (RF) radiation is coupled to the gate and e.g. to the source terminal. The RF signal of the gate modulates the electron density while the source coupled signal is fed into this varying conductivity channel. The resulting behavior is equal to a powerlaw detector (like a bolometer) that measures the time averaged intensity. With decreasing gate potential, the electron sheet becomes thinner and more sensitive to the RF perturbation, thus the response becomes higher. As the transistor reaches subthreshold region, the photoresponse saturates and driving further the transistor into accumulation region, the response quickly drops as the inversion electron sheet disappears. In a symmetrically connected FET structure, there is no difference between the gate-source and gate-drain coupled signal rectification. At the same RF signal the photoresponses are equal but of opposite sign. The practical difference comes from the electronic and RF connectivity of the FET. The biasing is usually distinguished as open drain and current biased modes. In the former, beside the instrumentation load there is no active element connected to the source or drain terminals. In the current biased mode, non zero source drain current is forced to the transistor. It was demonstrated in various works, that the non zero sourcedrain current results in significantly higher responsivity, with the connotation of the increasing sensor noise due to 1/f flicker and shot noise [4]. Let be u ac GS , u ac GD the gate-source and gate-drain RF signals, than the ∆U S and ∆U D photoresponse can be modeled by DC current characteristics as [5]:η S(D) efficiency is derived from the coupling efficiency of the incoming radiation a...