Polarization Fizeau interferometer based on birefringent thin film

Abstract

A polarization Fizeau interferometer based on birefringent thin film is presented. The interferometer adopts a birefringent thin film to obtain orthogonally polarized and strictly common-path reference and test beams. Advantages include ease of implementation on large-aperture interferometer, measuring test optics from long distance, and achieving high fringe visibility. The phase shift is obtained by combining a quarterwave plate and an analyzer. The concepts illustrated are verified experimentally.