Polarization dependent infrared reflectivity studies of Si-doped MOCVD grown GaN/Sapphire epilayers

Talwar, Devki N.; Lin, Hao-Hsiung; Feng, Zhe Chuan

doi:10.1016/j.matchemphys.2020.123279

Cited by 2 publications

(2 citation statements)

References 56 publications

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“…However, our method can be applied to a structure of arbitrary number of layers, one of which could be a substrate. Theoretical details used here to calculate the reflectivity/transmission spectra at oblique-incidence for BeTe, ZnTe and BexZn1-xTe epifilms on GaAs substrate are reported elsewhere [20].…”

Section: Numerical Simulations Results and Discussionmentioning

confidence: 99%

“…Sec. 3) and using a multilayer optics methodology [19][20] we have systematically performed calculations of the s-and ppolarized reflectance [Rs,p()] and transmission [Ts,p()] spectra at oblique incidence (i) by considering apposite Fresnel coefficients. The results of binary BeTe (ZnTe)/GaAs (001) and ternary alloy Be0.5Zn0.5Te/GaAs (001) epifilms as well as BeTe/ZnTe/GaAs (001) SLs (cf.…”

Section: Introductionmentioning

confidence: 99%

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Assessment of optical phonons in BeTe, BexZn1-xTe, p-BeTe epilayers and BeTe/ZnTe/GaAs (001) superlattices

Talwar

Becla

2022

Appl. Phys. A

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Section: Numerical Simulations Results and Discussionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Assessment of optical phonons in BeTe, BexZn1-xTe, p-BeTe epilayers and BeTe/ZnTe/GaAs (001) superlattices

Talwar

Becla

2022

Appl. Phys. A

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High resolution synchrotron extended x-ray absorption fine structure and infrared spectroscopy analysis of MBE grown CdTe/InSb epifilms

Talwar

Lü

Ferguson

et al. 2021

Journal of Vacuum Science &Amp; Technology A: Vacuum, Surfaces, and Films

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Six CdTe thin epifilms were prepared by using molecular beam epitaxy on ion beam cleaned InSb (001) substrates with Tsub temperatures ranging from 25 to 250 °C. Thickness dependent vibrational and structural characteristics are meticulously examined by far-infrared reflectivity (FIR) and high-resolution synchrotron extended x-ray absorption spectroscopy (HR-XAS), respectively. The FIR measured line shapes and optical modes for samples prepared on ion beam cleaned InSb at Tsub ≤ 100 °C revealed abrupt interfaces while noticing segregated Sb atoms and In2Te3-like precipitates at CdTe-InSb interfaces for films grown on ion beam cleaned InSb at Tsub ≥ 230 °C. Our simulated reflectivity results, using a traditional multilayer (ambient/film/substrate) optics methodology, are compared reasonably well with the experimental data. To substantiate the Berreman effect, we have also investigated the transmission and reflectivity spectra of CdTe/InSb epilayers and (CdTe)m/(ZnTe)n/InSb superlattices at oblique incidence (θI = 45°). A clear distinction of the transverse optical (ωTO) phonons in the s-polarization and ωTO and longitudinal optical (ωLO) modes in the p-polarization has established a valuable method of assessing long wavelength optical phonon frequencies in technologically important materials. Comprehensive analysis of HR-XAS results on the structural characteristics of CdTe/InSb epilayers has provided values of bond lengths and coordination numbers in very good agreement with the existing bulk CdTe data.

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Polarization dependent infrared reflectivity studies of Si-doped MOCVD grown GaN/Sapphire epilayers

Cited by 2 publications

References 56 publications

Assessment of optical phonons in BeTe, BexZn1-xTe, p-BeTe epilayers and BeTe/ZnTe/GaAs (001) superlattices

Assessment of optical phonons in BeTe, BexZn1-xTe, p-BeTe epilayers and BeTe/ZnTe/GaAs (001) superlattices

High resolution synchrotron extended x-ray absorption fine structure and infrared spectroscopy analysis of MBE grown CdTe/InSb epifilms

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