Abstract:X‐ray spectra scattered at 90° by acrylic resin plates of various thicknesses are measured. The intensity and polarization of Compton‐scattered X‐rays are estimated from the spectra. As the thickness of the slab increases, the intensity increases but the polarization decreases. The optimal thickness for a polarized X‐ray fluorescence spectrometer is determined, which provides both high intensity and high polarization.
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