Polarisation analysis of neutron reflectivity from magnetic thin films

Fermon, C.; Miramond, Corinne; Ott, F.; Saux, G. Le

doi:10.1080/10238169608200091

Cited by 9 publications

(3 citation statements)

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“…The magnetic scattering length is of the same order of magnitude as the nuclear scattering length (see Table 1). The detailed theoretical treatment of the PNR can be found in [1,9,[45][46][47]. In practice one can say that PNR allows to obtain information on the amplitude of the magnetisation of the different layers of a system in the same way as can be done in the non polarised case.…”

Section: Polarised Neutron Reflectivity (Pnr)mentioning

confidence: 98%

Surfaces and interfaces characterization by neutron reflectometry

Ott

Cousin

Menelle

2004

Journal of Alloys and Compounds

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Section: Polarised Neutron Reflectivity (Pnr)mentioning

confidence: 98%

Surfaces and interfaces characterization by neutron reflectometry

Ott

Cousin

Menelle

2004

Journal of Alloys and Compounds

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“…Below this limit, one must solve the Schrödinger equation and perform a full dynamical calculation. The detailed theoretical treatment of the polarized reflectivity can be found in [20][21][22][23][24]. Figure 3(a) presents the situation of the reflection of a neutron beam on a multilayer Si Cu/Cr: above the critical wavevector of total reflection, the reflected intensity decreases as 1/Q 4 .…”

Section: Specular Reflectivitymentioning

confidence: 99%

Neutron studies of magnetic oxide thin films

Ott¹

2008

J. Phys.: Condens. Matter

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We describe the use of neutron scattering techniques such as reflectivity and diffraction for the study of oxide thin films. We first describe how neutron reflectivity can complement x-ray reflectivity for the study of some oxide materials. We then emphasize magnetic thin films which have become an important field of study in the 1990s, following the discovery of new phenomena in heterostructures: magnetic exchange coupling, exchange bias coupling at antiferro/ferromagnetic interfaces, enhanced magnetism in ultrathin films or tunnel magnetoresistance for example. We show how neutron scattering can provide detailed quantitative information about the magnetization depth profiles of thin films and about the magnetic order in epitaxial films.

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Section: Specular Reflectivity 211 Principlesmentioning

confidence: 99%

Neutron scattering on magnetic surfaces

Ott

2007

Comptes Rendus. Physique

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During the early 1980s, advanced techniques for the deposition of ultra-thin metal films were developed. The combination of different types of materials gave rise to new physical phenomena such as the magnetic exchange coupling in superlattices or the exchange bias between ferro and anti-ferro layers. The field was very active because of the associated industrial applications in magnetic field sensors. New types of heterostructures combining magnetic oxides, insulating oxides or magnetic semiconductors are still being developed. Alongside the fabrication of these new meta-materials made of thin films stacking, polarized neutron reflectometry has emerged as a routine tool for the characterization of magnetic hetero-structures. In the recent years, the new developments of polarized reflectivity have been connected to the study of micro and nanostructures, especially micromagnetic structures in multilayers. The technique of off-specular scattering has been developed for the study of the roughness or the micromagnetism at a micrometric scale. For the study of nanometric structures, in the range below 100 nm, grazing incidence Small Angle Scattering is being considered. To cite this article: F.

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Polarisation analysis of neutron reflectivity from magnetic thin films

Cited by 9 publications

References 0 publications

Surfaces and interfaces characterization by neutron reflectometry

Surfaces and interfaces characterization by neutron reflectometry

Neutron studies of magnetic oxide thin films

Neutron scattering on magnetic surfaces

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