2022
DOI: 10.1063/5.0075014
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Polar-axis-oriented epitaxial tetragonal (Bi,K)TiO3 films with large remanent polarization deposited below Curie temperature by a hydrothermal method

Abstract: A hydrothermal method was used to epitaxially grow 70-nm-thick tetragonal (Bi,K)TiO3 films with stoichiometric compositions at 240 °C on (001)cSrRuO3//(001)SrTiO3 substrates. Crystal structure analysis revealed that the obtained (Bi,K)TiO3 films had a polar-axis orientation attributable to the matching of the in-plane lattice with the SrRuO3 underlayer. Large coherent displacement of A-site ions along the polar direction observed by transmission electron microscopy may have induced the large tetragonal distort… Show more

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Cited by 8 publications
(6 citation statements)
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“…This is basically the same result as our previous reports for a film with x = 0, (Bi,K)TiO 3 . 22) In the case of the film with x = 0.27 located in Region 2, an additional spot originating from Peak II was observed together with the spots observed for the films with x = 0.12 located in Region 1, as shown in Figs. 3(c) and 3(d).…”
Section: Crystal Structuresmentioning
confidence: 56%
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“…This is basically the same result as our previous reports for a film with x = 0, (Bi,K)TiO 3 . 22) In the case of the film with x = 0.27 located in Region 2, an additional spot originating from Peak II was observed together with the spots observed for the films with x = 0.12 located in Region 1, as shown in Figs. 3(c) and 3(d).…”
Section: Crystal Structuresmentioning
confidence: 56%
“…© 2023 The Japan Society of Applied Physics displacement. 22) The larger displacement of Bi ions than that of K ions would contribute to a large tetragonality. This suggests that the unique structure observed in (Bi,K)TiO 3 films is kept up to x = 0.12 despite the formation of the solid solution with CaTiO 3 .…”
Section: Sm1012-3mentioning
confidence: 99%
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“…Amplitude, phase, and frequency images show domains with a lateral scale of hundreds of nanometers with variable piezoresponses. Imaging, domain writing, hysteresis loop measurements, and electric field cycling on the macroscopic device [41][42][43][44][45][46][47] were recorded.…”
Section: Baseline Characterization Of Filmsmentioning
confidence: 99%