2005
DOI: 10.1063/1.1942630
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Polar anchoring energy measurement of vertically aligned liquid-crystal cells

Abstract: Anchoring energy enhancement and pretilt angle control of liquid crystal alignment on polymerized surfaces AIP Advances 5, 097218 (2015);

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Cited by 40 publications
(28 citation statements)
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“…Moreover, as shown in Figure 4(a), the slope of the EO curve of the LC cell with a 2.5 wt% RM concentration was quite steep, indicating the weak-anchoring case [24]. Now, the polar anchoring energy is determined using a high-electric-field method [25][26][27][28]. The polar anchoring energy (W) can be deduced from the following relationship between (R/R 0 − 1)CV and CV [27]:…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…Moreover, as shown in Figure 4(a), the slope of the EO curve of the LC cell with a 2.5 wt% RM concentration was quite steep, indicating the weak-anchoring case [24]. Now, the polar anchoring energy is determined using a high-electric-field method [25][26][27][28]. The polar anchoring energy (W) can be deduced from the following relationship between (R/R 0 − 1)CV and CV [27]:…”
Section: Resultsmentioning
confidence: 99%
“…Now, the polar anchoring energy is determined using a high-electric-field method [25][26][27][28]. The polar anchoring energy (W) can be deduced from the following relationship between (R/R 0 − 1)CV and CV [27]:…”
Section: Resultsmentioning
confidence: 99%
“…The voltage-dependent of phase retardation value of a VA cell was determined by measuring the transmission as a function of applied voltage, and the anchoring energy was obtained by a linear-fitting of phase retardation versus applied voltage curve. 12 The pretilt angle was measured and confirmed by crystal rotation and magnetic null methods, where an accuracy of 0.1…”
Section: Methodsmentioning
confidence: 99%
“…Due to the designed common-path configuration, the phase retardation of the LC cell can be accurately determined in terms of the phase difference of the optical heterodyne signal. The polar anchoring energy (PAE) of the POSSdoped PI and UV-treated PI alignment layers was measured by using the high electric field method (Yu et al, 1999;Nie et al, 2005). Ultraviolet-visible (UV-vis) spectra of PIs were measured with an UV-vis spectrophotometer.…”
Section: Characterization Of Pi Alignment Layersmentioning
confidence: 99%