Abstract:The Pockels’ effect has been demonstrated in thermally evaporated polycrystalline thin films of ZnS. The strongly (111)-oriented films were found to have an electro-optic constant of r41 = 3.3 × 10−13 m/V for fields perpendicular to the (111) planes. Extinction ratios of up to 85% have been observed in an optical waveguide modulator. Analysis indicates a stress-related birefringence that manifests itself upon temperature change. The temperature coefficient of stress in the polycrystalline films was found to be… Show more
“…The high loss in polycrystalline ZnS waveguides are due to the combination of surface scattering and bulk scattering at the crystalline grain boundaries [3]. Therefore, a small grain size is necessary for a reduction of surface roughness and allows a reduction of the scattering [4]. Smallest grain size of ZnS can be found in its amorphous thin films and can be prepaid by depositing on the cold substrate.…”
Zinc sulfide (ZnS) thin films as the waveguide medium have been deposited onto oxidized silicon wafer substrates at cold temperature (Tcold = –50oC) and ambient temperature (Tambient = 25oC) by thermal evaporation technique. The surface morphology of ZnS films were pictured with an atomic force microscopy (AFM) and the surface roughness were calculated from the AFM images. The propagation losses of the samples were measured using a scanning detection technique attached to a prism coupler. The AFM results revealed that the surface of cold deposited ZnS film is rougher than the surface of ambient deposited ZnS film. The propagation losses of the cold deposited ZnS waveguide are consistently lower than the ambient deposited ZnS waveguide at all measured wavelengths.
“…The high loss in polycrystalline ZnS waveguides are due to the combination of surface scattering and bulk scattering at the crystalline grain boundaries [3]. Therefore, a small grain size is necessary for a reduction of surface roughness and allows a reduction of the scattering [4]. Smallest grain size of ZnS can be found in its amorphous thin films and can be prepaid by depositing on the cold substrate.…”
Zinc sulfide (ZnS) thin films as the waveguide medium have been deposited onto oxidized silicon wafer substrates at cold temperature (Tcold = –50oC) and ambient temperature (Tambient = 25oC) by thermal evaporation technique. The surface morphology of ZnS films were pictured with an atomic force microscopy (AFM) and the surface roughness were calculated from the AFM images. The propagation losses of the samples were measured using a scanning detection technique attached to a prism coupler. The AFM results revealed that the surface of cold deposited ZnS film is rougher than the surface of ambient deposited ZnS film. The propagation losses of the cold deposited ZnS waveguide are consistently lower than the ambient deposited ZnS waveguide at all measured wavelengths.
“…The high loss in polycrystalline ZnS waveguides are due to the combination of surface scattering and bulk scattering at the crystalline grain boundaries [3]. Therefore, a small grain size is necessary for a reduction of surface roughness and allows a reduction of the scattering [4]. Thermal depositions of dielectrics are well known for fabrication of anti-reflection coatings can also be used to produce ZnS waveguides.…”
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.