Pneumatic shutter for high power arc lamps

Curzon, F. L.; Neyssari, C; Burrill, P; Cheuck, A

doi:10.1088/0022-3735/20/8/021

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1991

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“…However, the accuracy of lattice-constant measurements using ECP was considered to be much inferior to X-ray methods. Although less precise than X-rays, it was shown that using high-order Lauezone (HOLZ) lines in ECP considerably improves the accuracy of lattice-parameter measurements with this technique (Curzon & Rajora, 1987;Kozubowski, Gerberich & Stefanski, 1988;Madden & Hren, 1985). Provided that the electron wavelength is known with sufficient accuracy, the ECP method is good to within 0.2%.…”

Section: Introductionmentioning

confidence: 99%

Effects of tetragonal distortion in thin expitaxic films on electron channeling patterns in scanning electron microscopy

Kozubowski¹,

Keller²

1991

J Appl Cryst

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The elastic strain state in a 25 nm (In,Ga)As epitaxic film deposited on a (001) GaAs substrate includes a Poisson expansion perpendicular to the interface. This creates a tetragonally distorted lattice in the film which shifts high-order Laue-zone (HOLZ) lines in electron channeling patterns (ECP) from the film compared to ECP's from pure GaAs. The line shifts are predictable, thereby allowing measurement of elastic strains parallel and perpendicular to the film/ substrate interface independently. The technique appears to have an accuracy close to 0.2%.

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Section: Introductionmentioning

confidence: 99%