Plausible degradation mechanisms in organic light-emitting diodes

Jou, Jwo‐Huei; Lin, Yiping; Su, Yu-Ting; Song, Wei-Chi; Kumar, Shiv; Dubey, Deepak Kumar; Shyue, Jing‐Jong; Chang, Hsun-Yun; You, Yun-Wen; Liang, Tzu-Wei

doi:10.1016/j.orgel.2019.01.035

Cited by 12 publications

(6 citation statements)

References 47 publications

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“…It is believed that the decomposition and diffusion of OLED compounds caused the reduction of luminance. In a previous study, similar results, which led to the conclusion that the migration of small molecules caused the degradation of OLED performance, were reported . What we can conclude based on our measurements is that there are defects which have developed during the aging study and which are comprised of small hydrocarbon fragments.…”

Section: Resultssupporting

confidence: 88%

“…In a previous study, similar results, which led to the conclusion that the migration of small molecules caused the degradation of OLED performance, were reported. [16][17][18] What we can conclude based on our measurements is that there are defects which have developed during the aging study and which are comprised of small hydrocarbon fragments. Within the defect areas, there is significant molecular diffusion and degradation;…”

Section: Ms/ms Depth Profilingmentioning

confidence: 99%

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Time‐of‐flight secondary ion tandem mass spectrometry depth profiling of organic light‐emitting diode devices for elucidating the degradation process

Iida

Murakami

Kurosawa

et al. 2020

Rapid Comm Mass Spectrometry

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Rationale Organic light‐emitting diode (OLED) products based on display applications have become popular in the past 10 years, and new products are being commercialized with rapid frequency. Despite the many advantages of OLEDs, these devices still have a problem concerning lifetime. To gain an understanding of the degradation process, the authors have investigated the molecular information for deteriorated OLED devices using time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS). Methods TOF‐SIMS depth profiling is an indispensable method for evaluating OLED devices. However, the depth profiles of OLEDs are generally difficult due to the mass interference among organic compounds, including degradation products. In this study, the tandem mass spectrometry (MS/MS) depth profiling method was used to characterize OLED devices. Results After degradation, defects comprised of small hydrocarbons were observed. Within the defect area, the diffusion of all OLED compounds was also observed. It is supposed that the source of the small hydrocarbons derives from decomposition of the OLED compounds and/or contaminants at the ITO interface. Conclusions The true compound distributions have been determined using MS/MS depth profiling methods. The results suggest that luminance decay is mainly due to the decomposition and diffusion of OLED compounds, and that OLED decomposition may be accelerated by adventitious hydrocarbons present at the ITO surface.

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Section: Resultssupporting

confidence: 88%

Section: Ms/ms Depth Profilingmentioning

confidence: 99%

Time‐of‐flight secondary ion tandem mass spectrometry depth profiling of organic light‐emitting diode devices for elucidating the degradation process

Iida

Murakami

Kurosawa

et al. 2020

Rapid Comm Mass Spectrometry

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“…Specifically, it increased from 2.8 to 8.8 nm as the bias was applied for 15 min. The increasing roughness may be attributed to the continuous growth of the spikes upon applying the bias, which might be resulted from the comparatively easy electromigration of pure aluminum atoms under an external field. − …”

Section: Resultsmentioning

confidence: 99%

Minor Copper-Doped Aluminum Alloy Enabling Long-Lifetime Organic Light-Emitting Diodes

Lin

Huang

Tsai

et al. 2022

ACS Appl. Mater. Interfaces

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Aluminum has been extensively used as a conductor material in numerous electronic devices, including solar cells, light-emitting diodes (LEDs), organic LEDs (OLEDs), and thin-film transistors. However, its spiking surface and easy electromigration have limited its performance. To overcome this, a trace amount of nonprecious copper dopant has been proven effective in enhancing device reliability. Nevertheless, a comprehensive investigation regarding the effect of copper doping on the morphology at the aluminum conductor−organic interface is yet to be done. We had hence fabricated a series of green OLED devices to probe how copper doping affected the aluminum conductor, morphologically and electrically, and the corresponding device's efficiency and lifetime performance. We found 4 wt % copper doping to be highly effective in enabling a spike-less and smoother aluminum interface, which in turn enabled the fabrication of devices with much higher efficiency and lifetime. Specifically, the corresponding power efficacy at 1000 cd/m 2 was increased from 32 to 42 lm/W and the lifetime increased from 75 to 263 h, an increment of 250%. Atomic force microscopy confirmed that the copper doping did help smooth out the conductor interface as deposited and reduce electromigration upon operation.

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“…The oxidation of Ag at the anode into Ag + cations, which subsequently migrate through the electric field and are electrochemically reduced back to zerovalent metal when they come into contact with the cathode, is one proposed mechanism [115]. Some systems are mainly produced by momentum transfer from moving charge carriers to metal atoms, which are subsequently pushed forward by an "electron wind" or "hole wind" [116,117]. To distinguish it from electrochemical migration, this latter mechanism is called electromigration.…”

Section: Effects Of Electron Migration On Oledmentioning

confidence: 99%

Unraveling Degradation Processes and Strategies for Enhancing Reliability in Organic Light-Emitting Diodes

Naqvi,

Baig,

Farid

et al. 2023

Nanomaterials

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Organic light-emitting diodes (OLEDs) have emerged as a promising technology for various applications owing to their advantages, including low-cost fabrication, flexibility, and compatibility. However, a limited lifetime hinders the practical application of OLEDs in electronic devices. OLEDs are prone to degradation effects during operation, resulting in a decrease in device lifetime and performance. This review article aims to provide an exciting overview of OLED degradation effects, highlighting the various degradation mechanisms. Subsequently, an in-depth exploration of OLEDs degradation mechanisms and failure modes is presented. Internal and external processes of degradation, as well as the reactions and impacts of some compounds on OLED performance, are then elucidated. To overcome degradation challenges, the review emphasizes the importance of utilizing state-of-the-art analytical techniques and the role of these techniques in enhancing the performance and reliability of OLEDs. Furthermore, the review addresses the critical challenges of lifetime and device stability, which are crucial for the commercialization of OLEDs. This study also explores strategies to improve OLEDs’ lifetime and stability, such as using barrier layers and encapsulation techniques. Overall, this article aims to contribute to the advancement of OLED technology and its successful integration into diverse electronic applications.

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Plausible degradation mechanisms in organic light-emitting diodes

Cited by 12 publications

References 47 publications

Time‐of‐flight secondary ion tandem mass spectrometry depth profiling of organic light‐emitting diode devices for elucidating the degradation process

Time‐of‐flight secondary ion tandem mass spectrometry depth profiling of organic light‐emitting diode devices for elucidating the degradation process

Minor Copper-Doped Aluminum Alloy Enabling Long-Lifetime Organic Light-Emitting Diodes

Unraveling Degradation Processes and Strategies for Enhancing Reliability in Organic Light-Emitting Diodes

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