2019
DOI: 10.1109/lpt.2019.2914428
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Plasmonically Enhanced Amorphous Silicon Photodetector With Internal Gain

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Cited by 8 publications
(1 citation statement)
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“…To overcome the recovery time limitations associated with standard PC switching, devices have been fabricated using a variety of unconventional semiconductor materials some of which include amorphous Si [4], low temperature (LT) molecular beam epitaxy (MBE ) grown GaAs [5], [6], and radiation damaged (RD) Si on sapphire (SOS) [7]. The fabrication processes for the amorphous Si devices (thermal decomposition of silane through chemical vapour deposition (CVD) [4], the LT GaAS devices (MBE growth at 200 0 C on semi insulating GaAs) [8], and the RD SOS devices (ion implantation with 200 keV O + ions at 1 x 10 14 cm 2 and 100 keV O + ions at 1 x 10 15 cm 2 ) [9] serve to introduce carrier traps and recombination centres within the lattice to inhibit the continuation of charge carrier transport. The carrier lifetime within the device is reduced, therefore, and the generated electrical transient is terminated (here the convention has been adopted that the term lifetime refers to both carrier recombination).…”
Section: Introductionmentioning
confidence: 99%
“…To overcome the recovery time limitations associated with standard PC switching, devices have been fabricated using a variety of unconventional semiconductor materials some of which include amorphous Si [4], low temperature (LT) molecular beam epitaxy (MBE ) grown GaAs [5], [6], and radiation damaged (RD) Si on sapphire (SOS) [7]. The fabrication processes for the amorphous Si devices (thermal decomposition of silane through chemical vapour deposition (CVD) [4], the LT GaAS devices (MBE growth at 200 0 C on semi insulating GaAs) [8], and the RD SOS devices (ion implantation with 200 keV O + ions at 1 x 10 14 cm 2 and 100 keV O + ions at 1 x 10 15 cm 2 ) [9] serve to introduce carrier traps and recombination centres within the lattice to inhibit the continuation of charge carrier transport. The carrier lifetime within the device is reduced, therefore, and the generated electrical transient is terminated (here the convention has been adopted that the term lifetime refers to both carrier recombination).…”
Section: Introductionmentioning
confidence: 99%