Correlative Probe Electron Microscopy (CPEM) was used to investigate the topographical and electronic emission properties of gallium-doped zinc oxide nanorods (ZnO:Ga) after low pressure hydrogen or oxygen plasma treatment. Simultaneous secondary electron (SE) and back-scattered electron (BSE) emission information from the same nanorods enabled true correlation with the topographical information obtained by atomic force microscopy (AFM). All nanorods were analyzed in-situ on the same substrate using the same experimental parameters which allowed for accurate comparison. ZnO:Ga nanorods displayed the largest SE emission intensity as well as the greatest BSE emission intensity. Hydrogen plasma treatment reduced both SE and BSE emission intensity, whereas oxygen plasma treatment only reduced SE emission. These effects may help elucidate various optical as well as biological interactions of ZnO:Ga nanorods.