“…However, further increase of H 2 or C 2 H 2 content provokes a drastic decrease of the hydrophobicity that may be caused by the decreasing fluorine reactive species quantity. The similar results were found in the case of other fluorocarbon films obtained for C n F (2 n +2) /H 2 mixtures. − The results of optical emission spectroscopy showed that the fluorine atom concentration passed through a minimum between 10 and 18% of hydrogen owing to the formation of the unreactive stable HF compound and then increased again. , The optimized plasma conditions for CF 4 /H 2 and CF 4 /C 2 H 2 gas mixtures are presented in Table .…”
Section: Resultssupporting
confidence: 72%
“…However, for EVOHDT29 film treated by CF 4 /H 2 plasma, the peak attributed to the presence of CF 3 groups on the film surface (at 688.7 eV) was found to be twice higher than that of CF groups (at 686.1 eV) (Figure b). This confirms that the presence of hydrogen in CF 4 plasma gas leads to the creation of very stable HF molecules. , Besides, it is known that CF 3 and CF 2 groups make the main contribution to the hydrophobic nature of the material …”
Section: Resultssupporting
confidence: 67%
“…D’Agostino et al studied the effect of the hydrogen addition, a scavenger of fluorine atoms, to C n F (2 n +2) discharges. ,, The fluorine atom concentration was found to decrease and the CF • and CF 2 • radical concentrations were found to increase with increasing hydrogen percentage. The hydrogen in the plasma phase reacts with the atomic fluorine that leads to the creation of very stable HF molecules which are inactive in the plasma atmosphere. − On the other hand, it is known that the presence of C 2 H 2 in plasma improves the barrier properties by the formation of a polymerized layer on the treated surface. This hydrophobic layer has a compact tridimensional network and may serve as a barrier for permeant diffusion. , Therefore, mixtures of CF 4 with H 2 and C 2 H 2 gases were used in order to enhance the hydrophobicity of EVOH films.…”
Section: Resultsmentioning
confidence: 99%
“…This confirms that the presence of hydrogen in CF 4 plasma gas leads to the creation of very stable HF molecules. 26,27 Besides, it is known that CF 3 and CF 2 groups make the main contribution to the hydrophobic nature of the material. 11 To better understand the fluorined plasma treatment and to know about the fluorine plasma effect in depth, XPS sputtering has been carried out.…”
Poly(ethylene-co-vinyl alcohol) (EVOH)
films with
two different ethylene contents (29 and 44 mol %) have been treated
by hydrophobic plasma (CF4, tetramethylsilane (TMS), CF4/H2, and CF4/C2H2). Conditions of the cold plasma treatment were optimized by the
water contact angle measurements as a function of the different plasma
parameters (plasma power, gas flow, and treatment time). Chemical
changes of the film surface were characterized by X-ray photoelectron
spectroscopy. The obtained results revealed the presence of fluorine
containing functional groups such as CF, CF2, and CF3 in the case of CF4, CF4/H2, and CF4/C2H2 plasma treatment
and the presence of SiO
x
C
y
compounds after TMS treatment. The morphology of
the plasma treated EVOH films was examined by atomic force microscopy,
which indicated an increase of the film roughness after treatment.
Negligible changes of thermal properties of the modified EVOH films
were observed by means of the temperature modulated differential scanning
calorimetry. The barrier properties of films were characterized by
water permeability measurements. It was found that the hydrophobicity
was significantly improved after plasma treatment and for some treated
films the water permeability was decreased up to 28%.
“…However, further increase of H 2 or C 2 H 2 content provokes a drastic decrease of the hydrophobicity that may be caused by the decreasing fluorine reactive species quantity. The similar results were found in the case of other fluorocarbon films obtained for C n F (2 n +2) /H 2 mixtures. − The results of optical emission spectroscopy showed that the fluorine atom concentration passed through a minimum between 10 and 18% of hydrogen owing to the formation of the unreactive stable HF compound and then increased again. , The optimized plasma conditions for CF 4 /H 2 and CF 4 /C 2 H 2 gas mixtures are presented in Table .…”
Section: Resultssupporting
confidence: 72%
“…However, for EVOHDT29 film treated by CF 4 /H 2 plasma, the peak attributed to the presence of CF 3 groups on the film surface (at 688.7 eV) was found to be twice higher than that of CF groups (at 686.1 eV) (Figure b). This confirms that the presence of hydrogen in CF 4 plasma gas leads to the creation of very stable HF molecules. , Besides, it is known that CF 3 and CF 2 groups make the main contribution to the hydrophobic nature of the material …”
Section: Resultssupporting
confidence: 67%
“…D’Agostino et al studied the effect of the hydrogen addition, a scavenger of fluorine atoms, to C n F (2 n +2) discharges. ,, The fluorine atom concentration was found to decrease and the CF • and CF 2 • radical concentrations were found to increase with increasing hydrogen percentage. The hydrogen in the plasma phase reacts with the atomic fluorine that leads to the creation of very stable HF molecules which are inactive in the plasma atmosphere. − On the other hand, it is known that the presence of C 2 H 2 in plasma improves the barrier properties by the formation of a polymerized layer on the treated surface. This hydrophobic layer has a compact tridimensional network and may serve as a barrier for permeant diffusion. , Therefore, mixtures of CF 4 with H 2 and C 2 H 2 gases were used in order to enhance the hydrophobicity of EVOH films.…”
Section: Resultsmentioning
confidence: 99%
“…This confirms that the presence of hydrogen in CF 4 plasma gas leads to the creation of very stable HF molecules. 26,27 Besides, it is known that CF 3 and CF 2 groups make the main contribution to the hydrophobic nature of the material. 11 To better understand the fluorined plasma treatment and to know about the fluorine plasma effect in depth, XPS sputtering has been carried out.…”
Poly(ethylene-co-vinyl alcohol) (EVOH)
films with
two different ethylene contents (29 and 44 mol %) have been treated
by hydrophobic plasma (CF4, tetramethylsilane (TMS), CF4/H2, and CF4/C2H2). Conditions of the cold plasma treatment were optimized by the
water contact angle measurements as a function of the different plasma
parameters (plasma power, gas flow, and treatment time). Chemical
changes of the film surface were characterized by X-ray photoelectron
spectroscopy. The obtained results revealed the presence of fluorine
containing functional groups such as CF, CF2, and CF3 in the case of CF4, CF4/H2, and CF4/C2H2 plasma treatment
and the presence of SiO
x
C
y
compounds after TMS treatment. The morphology of
the plasma treated EVOH films was examined by atomic force microscopy,
which indicated an increase of the film roughness after treatment.
Negligible changes of thermal properties of the modified EVOH films
were observed by means of the temperature modulated differential scanning
calorimetry. The barrier properties of films were characterized by
water permeability measurements. It was found that the hydrophobicity
was significantly improved after plasma treatment and for some treated
films the water permeability was decreased up to 28%.
“…The only silicon-containing material present was the glass plasma reactor.In a typical experiment a sample of PP film was placed symmetrically in the center of the reaction chamber and the chamber was evacuated to the base pressure and then vacuumed (base pressure) and repressurized (20 mmHg) several times with argon in order to remove possible gas contaminants. Car-Stainless steel trap (liquid NJ 6 Coupling coil12 Vacuum pump Diagram of plasma nitrogen cold trap.…”
SYNOPSISExtensive research has been carried out in recent years using fluorocarbon plasmas for modification and depositions on polymer substrates. In some cases anomalous results have been obtained that are not explainable based on conventional fluorine chemistry. In this investigation pure polypropylene films were exposed to carbon tetrafluoride plasmas in a Pyrex glass reactor. A t short reaction times (less than 1 min) significant amount of silicon was detected by ESCA on the surface of the films. Analysis of liquid nitrogen trapped fluorocarbon plasma gases and molecular fragments indicated high concentrations of silicon and carbon containing species, the former indicative of ablation and etching reactions of the glass reactor walls. The production of a relatively high quantity of fluorosilicon derivatives was explained by the greater affinity of silicon for fluorine than for carbon, with the tendency to readily form SiF,. These fluorosilicon radical and ionic species generated under cold plasma conditions can easily react with polymeric substrates causing unexpected surface modifications. In addition Si-F bonds could be readily hydrolyzed to SiOH islands on the surface of the substrate to impart anomalous characteristics.
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