2019
DOI: 10.1063/1.5127050
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Plasma diagnostic tools for ECR ion sources—What can we learn from these experiments for the next generation sources

Abstract: This is a self-archived version of an original article. This version may differ from the original in pagination and typographic details.

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Cited by 9 publications
(6 citation statements)
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“…The plasma stability will be investigated using the technique described in [8], as well as the lost electron energy distribution [9] (LEED) which is unknown in an ECR CUSP configuration. Finally, the ion beam quality will be studied, with Faraday cups in different locations along the beam line for current measurement, giving information on the transport of the intense beam, and a pepperpot device [10] for emittance measurement.…”
Section: Objectives Of Future Experimental Sessionsmentioning
confidence: 99%
“…The plasma stability will be investigated using the technique described in [8], as well as the lost electron energy distribution [9] (LEED) which is unknown in an ECR CUSP configuration. Finally, the ion beam quality will be studied, with Faraday cups in different locations along the beam line for current measurement, giving information on the transport of the intense beam, and a pepperpot device [10] for emittance measurement.…”
Section: Objectives Of Future Experimental Sessionsmentioning
confidence: 99%
“…1). 𝐵𝑟𝑖𝑔ℎ𝑡𝑛𝑒𝑠𝑠 = 𝐼 𝜀 𝑥 𝜀 𝑦 (1) 19th International Conference on Ion Sources -ICIS2021 Journal of Physics: Conference Series 2244 (2022) 012105…”
Section: Adjustment Proceduresmentioning
confidence: 99%
“…An ECR ion source has various parameters such as RF power and gas pressure, which influence each other. The parameters are varied every time during operation and some of them are highly experieence dependent [1]. Therefore, the adjustment time, beam intensity and beam quality may vary depending on the operator.…”
Section: Introductionmentioning
confidence: 99%
“…Plasma diagnostics is also strongly required to drive and benchmark the development of ECRIS simulation codes [6,7]. Over the years, various diagnostics techniques have been developed for application in ECRIS plasma, such as Langmuir probe diagnostics, x-ray diagnostics, interferopolarimetry, optical emission spectroscopy (OES) [8]. OES is probably the most remarkable for application in ECRIS under routine operations: it requires little room for operation (just a quartz window to access the plasma light), it does not affect nor is affected by plasma and it works also in high-voltage conditions, required for beam extraction.…”
Section: Introductionmentioning
confidence: 99%