Planar Object Surface Shape Speckle Pattern Deflectometry Based on Digital Image Correlation

Haichao, 汤海潮 Tang; Dahai, 李大海 Li; Lei, 李磊 Li; Pengyu, 陈鹏宇 Chen; Ruiyang, 王瑞阳 Wang; Qionghua, 王琼华 Wang

doi:10.3788/aos201939.0212006

Cited by 4 publications

(1 citation statement)

References 0 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Thus, the DIC method is not available. To solve this issue, PMD-based speckle pattern shifting deflectometry based on DIC [28,29] has been applied to flat specular surface shape measurement because of its robustness over noises compared with PMD with sinusoidal fringes and phase shifting algorithms [30]. Precise systematic calibration is still critical for micron-level accurate shape measurement.…”

Section: Introductionmentioning

confidence: 99%

Dynamic Deformation Measurement of Specular Surface with Deflectometry and Speckle Digital Image Correlation

Wang

Cheng

et al. 2020

Sensors

View full text Add to dashboard Cite

The deformation measurement of a specular surface is of great importance during the quality inspection and installation of optical elements or wafers, especially those with large apertures. We propose a deflectometry method with speckle digital image correlation (DeSDIC) to realize the dynamic and high-accuracy measurement of the deformation on specular surfaces, with a simple system structure and robustness to noises and environmental vibrations. Random speckle pattern displayed on liquid crystal display is reflected by the original surface under test (SUT), and the distorted pattern is recorded by a camera. This originally distorted pattern is taken as the reference image, and the patterns captured afterwards are digitally correlated with the reference image to calculate the gradient change and deformation of the SUT. The theoretical relationships and an experimental one-step calibration scheme are proposed. Both static and dynamic deformations of a deformable mirror were experimentally measured to demonstrate the feasibility and accuracy of DeSDIC, which is comparable to phase-measuring deflectometry and interferometry.

show abstract

Section: Introductionmentioning

confidence: 99%