2001
DOI: 10.1016/s0168-583x(01)00797-2
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Planar ion-channeling measurements on buried nano-films

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“…In particular for superlattices lacking a high degree of perfection, this approach can compete with techniques as XRD and TEM [61]. On the other hand, Ijzendoorn and coworkers relied on the varying flux distribution as a function of the angle between the ion beam and the axis, to very accurately deduce the strain in extremely thin buried films [62,63]. The presence of this strained film results in a step in the substrate signal for channeling along a non-normal direction.…”
Section: Tablementioning
confidence: 99%
“…In particular for superlattices lacking a high degree of perfection, this approach can compete with techniques as XRD and TEM [61]. On the other hand, Ijzendoorn and coworkers relied on the varying flux distribution as a function of the angle between the ion beam and the axis, to very accurately deduce the strain in extremely thin buried films [62,63]. The presence of this strained film results in a step in the substrate signal for channeling along a non-normal direction.…”
Section: Tablementioning
confidence: 99%