2022
DOI: 10.1016/j.sna.2022.113941
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Planar array capacitive imaging method based on data optimization

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Cited by 2 publications
(1 citation statement)
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“…Defect detection is accomplished by measuring the changes in capacitance value (Yin et al , 2020b). CI technology has two significant characteristics when compared to conventional nondestructive testing (NDT) techniques (Abdollahi-Mamoudan et al , 2021; Yin et al , 2016; Zhang et al , 2022). First, regarding the detection range, CI technology can detect defects in conductive and nonconductive materials.…”
Section: Introductionmentioning
confidence: 99%
“…Defect detection is accomplished by measuring the changes in capacitance value (Yin et al , 2020b). CI technology has two significant characteristics when compared to conventional nondestructive testing (NDT) techniques (Abdollahi-Mamoudan et al , 2021; Yin et al , 2016; Zhang et al , 2022). First, regarding the detection range, CI technology can detect defects in conductive and nonconductive materials.…”
Section: Introductionmentioning
confidence: 99%