Abstract:Field programmable gate arrays are used as a core component in many safety and mission critical applications. In most cases these systems will be continuously exposed to radiations and change in temperature and pressure. This can result in defects within the IC which leads to malfunctioning or total system failure before mission completion. Traditionally, fault tolerance in FPGA is achieved by using spare cells to replace a faulty cell. Higher fault coverage demands more number of spares. So there is a need to… Show more
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