PIXE determination of element distribution in <i>Fomes fomentarius</i>

Král, Jaroslav; Voltr, J.; Proška, Jan; Gabriel, Jiřı́; Baldrián, Petr; Černý, J.; Svejda, Jan Taro

doi:10.1002/xrs.830

Cited by 7 publications

(6 citation statements)

References 8 publications

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“…Earlier PIXE studies have shown the elemental composition in fungal fruiting bodies (Kral et al 2005), ectomycorrhizal roots and hyphae (Wallander et al 2003), bladders of the fungus Geosiphon pyriforme (Maetz et al 1999;Scheloske et al 2001), AM colonised roots (Scheloske et al 2004), and AM fungal spores (Przybylowicz et al 2004;Pallon et al 2007;Olsson et al 2008;Hammer et al 2011aHammer et al , 2011b. In the PIXE studies of AM fungi a main focus has been the potential to accumulate heavy metals, in order to investigate if they can remediate contaminated soil (Weiersbye et al 1999;Turnau et al 2001).…”

Section: Introductionmentioning

confidence: 97%

Elemental composition in vesicles of an arbuscular mycorrhizal fungus, as revealed by PIXE analysis

et al. 2011

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Section: Introductionmentioning

confidence: 97%

Elemental composition in vesicles of an arbuscular mycorrhizal fungus, as revealed by PIXE analysis

et al. 2011

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“…Earlier studies have reported the elemental compositions of fungal fruit bodies (11), ectomycorrhizal roots and hyphae (31,34), the bladders of the fungus Geosiphon pyriforme (13,28), AM-colonized roots (27), and AM fungal spores (23,24,35). The focus of previous studies on AM fungi has been on their potential to accumulate heavy metals in order to investigate whether they can be used to remediate contaminated soil.…”

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confidence: 99%

Phosphorus Availability Influences Elemental Uptake in the Mycorrhizal Fungus Glomus intraradices , as Revealed by Particle-Induced X-Ray Emission Analysis

Olsson¹,

Hammer²,

Wallander³

et al. 2008

Appl Environ Microbiol

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We investigated element accumulation in the arbuscular mycorrhizal fungus Glomus intraradices. Fungal spores and mycelia growing in monoxenic cultures were analyzed. The elemental composition was quantified using particle-induced X-ray emission (PIXE) in combination with scanning transmission ion microscopy. In the spores, Ca and Fe were associated mainly with the spore wall, while P and K showed patchy distributions and their concentrations were correlated. Excess of P in the hyphal growth medium increased the P and Si concentrations in spores and increased the K/Ca ratio in spores. Increased P availability decreased the concentration of Zn and Mn in spores. We concluded that the availability of P influences the uptake and accumulation of several elements in spores. It is demonstrated that PIXE analysis is a powerful tool for quantitative analysis of elemental accumulation in fungal mycelia.Arbuscular mycorrhizal (AM) fungal spores are asexual lipidrich survival organs (32) formed on the soil mycelium. After germination, they provide the energy carbon (C) for the fungus before carbohydrates can be taken up through symbiotic exchange with plants. In addition to lipids, the spores are potential storage organs for mineral nutrients essential for the formation of a germ tube. However, the nutrients stored in spores may reflect not only the need for formation of new fungal biomass but also that of the plants that are being colonized. The establishment of new symbiotic relations could thus depend on the accumulation of plant-limiting nutrients in spores and their transport into the host roots for recognition of a nonparasitic intruder.The nutrient accumulation and distribution in AM fungal spores have not been studied in as much detail as carbon accumulation has (32), although there are clear links between the nutrient availability and C metabolism (16,17,18). Quantitative analysis of elemental composition in AM fungal mycelia is crucial for our understanding of the distribution of nutritional resources.Electron-based methods, such as energy-dispersive X-ray spectroscopy or electron probe microanalysis (5, 30), can be used to obtain elementary maps of thin sections of fixed biological tissues. However, quantification of intact structures is not possible with these methods.Particle-induced X-ray emission (PIXE) analysis is based on the analysis of characteristic X-rays emitted from specific elements bombarded with protons from an accelerator (10). PIXE can be used to analyze elemental distributions in three-dimensional structures, and no chemical fixation is needed. Use of this technique, in combination with scanning transmission ion microscopy (STIM), enables quantification of the amounts and distribution of elements in structures as small as AM fungal spores and hyphae. PIXE is analogous to energy-dispersive X-ray spectroscopy, but its sensitivity is much higher, allowing quantification at levels of g g Ϫ1 . Limitations of the PIXE method are that it requires an extensive amount of time and the number of samples tha...

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“…As the proton scattering on argon atoms may increase the beam size on the target, the beam diameter was monitored at the target location by a moving aluminium foil. [6] The Full Width at Half Maximum (FWHM) of the beam was found to be approximately 0.3 mm. The beam current was not measured during this analysis.…”

Section: Discussionmentioning

confidence: 97%

“…The pressure in the milliprobe chamber was stabilised at 75 Pa of the argon atmosphere to facilitate fluence measurement and to lower the risk of radiation damage. As the proton scattering on argon atoms may increase the beam size on the target, the beam diameter was monitored at the target location by a moving aluminium foil . The Full Width at Half Maximum (FWHM) of the beam was found to be approximately 0.3 mm.…”

Section: Analyses Of Postage Stampsmentioning

confidence: 99%

“…Filling the target chamber with gaseous atmosphere at a specific pressure can provide several benefits: it decreases thermal damage of the target and prevents charging of the non-conductive samples. [6] If the pressure is constant and the gas creates a well defined peak in the PIXE spectrum, then the peak area is proportional to the ion beam fluence. The relative elemental concentration can be then calculated by comparing the exposition fluences in various analyses.…”

Section: Introductionmentioning

confidence: 99%

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Measurement of proton beam fluence by PIXE analysis of residual gas

Voltr

Nejedlý²

2012

X-Ray Spectrometry

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Knowledge of beam fluence has a crucial role in quantitative particle‐induced X‐ray emission analysis. In some situations, a direct measurement of the beam charge on the target is either impossible or impractical. In such cases, indirect determination of the beam fluence can utilise the characteristic X‐ray of argon or other gases, which was being kept at a stable low partial pressure in the vicinity of the analysed sample. As the X‐ray signal of argon depends on the total charge, it can be used to quantify the charge. This paper describes the experimental design, the hardware and software modules that we created, the validation of the method, the application of the method during elemental analyses of fragile philatelic samples with overprints, and the lessons learned. Copyright © 2012 John Wiley & Sons, Ltd.

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PIXE determination of element distribution in Fomes fomentarius

Cited by 7 publications

References 8 publications

Elemental composition in vesicles of an arbuscular mycorrhizal fungus, as revealed by PIXE analysis

Elemental composition in vesicles of an arbuscular mycorrhizal fungus, as revealed by PIXE analysis

Phosphorus Availability Influences Elemental Uptake in the Mycorrhizal Fungus Glomus intraradices , as Revealed by Particle-Induced X-Ray Emission Analysis

Measurement of proton beam fluence by PIXE analysis of residual gas

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