2017
DOI: 10.1088/1742-6596/830/1/012044
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PIN-diode diagnostics of pulsed electron beam for high repetition rate mode

Abstract: Abstract. This work describes the operating principle and test results of the diagnostics for measuring the pulsed electron beam parameters under repetitive operation mode. The diagnostics is based on a PIN-diode, which is used as a bremsstrahlung detector. The signal from a PIN-diode was converted to a pseudo constant voltage signal which can be measured by a conventional voltmeter. Then the signal acquired by the voltmeter was compared with a reference signal indicating the normal operating regime of the acc… Show more

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Cited by 7 publications
(1 citation statement)
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“…It is verified by experimental and numerical means that under the irradiation of IPEBs, a temperature rise of several tens of K [26] can be induced in the target and the consequent thermal stress is an important cause of target damage. The situation of conversion layer damage can be monitored by online monitoring, such as with a semiconductor X-ray detector [46], and in tests with a titanium electron window, a window with a thickness within 100 µm can well secure the vacuum in the vacuum chamber [23], ensuring that, with the dual-layer target, the working vacuum can be kept even after conversion layer damage. However, frequent maintenance of the window system should undoubtedly be avoided in practical applications.…”
Section: Figure 12mentioning
confidence: 99%
“…It is verified by experimental and numerical means that under the irradiation of IPEBs, a temperature rise of several tens of K [26] can be induced in the target and the consequent thermal stress is an important cause of target damage. The situation of conversion layer damage can be monitored by online monitoring, such as with a semiconductor X-ray detector [46], and in tests with a titanium electron window, a window with a thickness within 100 µm can well secure the vacuum in the vacuum chamber [23], ensuring that, with the dual-layer target, the working vacuum can be kept even after conversion layer damage. However, frequent maintenance of the window system should undoubtedly be avoided in practical applications.…”
Section: Figure 12mentioning
confidence: 99%