2019
DOI: 10.1038/s41467-019-09650-8
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Piezoresponse force microscopy and nanoferroic phenomena

Abstract: Since its inception more than 25 years ago, Piezoresponse Force Microscopy (PFM) has become one of the mainstream techniques in the field of nanoferroic materials. This review describes the evolution of PFM from an imaging technique to a set of advanced methods, which have played a critical role in launching new areas of ferroic research, such as multiferroic devices and domain wall nanoelectronics. The paper reviews the impact of advanced PFM modes concerning the discovery and scientific understanding of nove… Show more

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Cited by 293 publications
(230 citation statements)
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“…Piezoresponse force microscopy (PFM) has evolved into a powerful tool for characterizing and manipulating the functional behavior of a wide range of ferroelectrics and related polar materials at the nanometer scale. [ 1 ] Along with other scanning probe microscopy (SPM) techniques it enabled the discovery of a series of phenomena, which inspired new fundamental physics and exciting device applications. One of the most notable examples is the observation of electrically conducting domain walls in otherwise insulating ferroic materials, such as magnetoelectric BiFeO 3 thin films, [ 2 ] improper ferroelectric ErMnO 3 crystals, [ 3 ] and proper ferroelectric LiNbO 3 crystals and films.…”
Section: Introductionmentioning
confidence: 99%
“…Piezoresponse force microscopy (PFM) has evolved into a powerful tool for characterizing and manipulating the functional behavior of a wide range of ferroelectrics and related polar materials at the nanometer scale. [ 1 ] Along with other scanning probe microscopy (SPM) techniques it enabled the discovery of a series of phenomena, which inspired new fundamental physics and exciting device applications. One of the most notable examples is the observation of electrically conducting domain walls in otherwise insulating ferroic materials, such as magnetoelectric BiFeO 3 thin films, [ 2 ] improper ferroelectric ErMnO 3 crystals, [ 3 ] and proper ferroelectric LiNbO 3 crystals and films.…”
Section: Introductionmentioning
confidence: 99%
“…Picoampere scale electric current from the suspended MoS 2 has been observed via C‐AFM . PFM mode is generally regarded as a powerful and direct way to characterize the piezoelectric and ferroelectric properties by applying an out‐of‐plane electric field to excite the sample through a conductive probe . Although there are sufficient attention and significant progress, it is still challenging to directly observe the piezoelectric response on atomically thin materials.…”
Section: Introductionmentioning
confidence: 99%
“…The piezoresponse force microscope (PFM) is a voltage-modulated version of AFM, and after Güthner et al used it to research the local poling of ferroelectric P(VDF-TrFE) film in 1992 [96], it took several years for PFM to become a mainstream analytical tool of ferroelectrics. PFM is able to image and manipulate ferroelectric domains nondestructively, and the physical properties (e.g., domain wall dynamics, bias of nucleation, piezoelectric coefficients, and coercive voltage) can be measured directly [97]. There have been many books and papers describing the technical details of PFM comprehensively [94,95,[98][99][100][101], and it is worth noting that the researchers need to understand the principle of PFM in order to avoid misinterpreting the data and drawing incorrect conclusions [97].…”
Section: Scanning Probe Microscope (Spm)mentioning
confidence: 99%
“…Aside from ferroelectricity, there can be several other factors causing ferroelectric-like PFM response. Thus, it is essential to verify the existence of ferroelectricity by detecting domains in diverse polarization directions and switching the domain states hysteretically under applied electric fields [94,97].…”
Section: Scanning Probe Microscope (Spm)mentioning
confidence: 99%