1993
DOI: 10.1126/science.262.5136.1029
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Picosecond Resolution in Scanning Tunneling Microscopy

Abstract: A method has been developed for performing fast time-resolved experiments with a scanning tunneling microscope. The method uses the intrinsic nonlinearity in the microscope's current versus voltage characteristics to resolve optically generated transient signals on picosecond time scales. The ability to combine the spatial resolution of tunneling microscopy with the time resolution of ultrafast optics yields a powerful tool for the investigation of dynamic phenomena on the atomic scale.

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Cited by 156 publications
(79 citation statements)
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“…The third class of combined microscopes [18][19][20][21][22] couples an STM tunnel junction with laser light. The tunnel junction is illuminated with two fine-tuned optical frequencies.…”
Section: Introductionmentioning
confidence: 99%
“…The third class of combined microscopes [18][19][20][21][22] couples an STM tunnel junction with laser light. The tunnel junction is illuminated with two fine-tuned optical frequencies.…”
Section: Introductionmentioning
confidence: 99%
“…This addresses, e.g., spin-resolved scanning-tunneling microscope experiments [30][31][32][33][34]. We choose B ini = ∞ to initially fully polarize the impurity spin.…”
mentioning
confidence: 99%
“…Hamers et al determined the recombination lifetime of photoexcited carriers in Si, in their pioneering work, by analyzing the observed surface photovoltage (SPV) by simulation [10], and a method that involves the combined use of an optical pulse pair and STM was proposed as photoconductive-gate STM (PG-STM) [11][12][13][14][15][16][17][18]. However, the spatial and temporal resolutions of the former method were limited to the 1 µm scale and laser-pulse repetition rate, respectively, and the PG-STM probes dI/dV or the quantity mediating the signal rather than the transient effect itself [18].…”
mentioning
confidence: 99%