Physics and the Information Revolution

Birnbaum, J.; Williams, R. Stanley

doi:10.1063/1.882936

Cited by 39 publications

(10 citation statements)

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“…This trend is not simply a consequence of the steady miniaturization in electron devices [1]. This trend is not simply a consequence of the steady miniaturization in electron devices [1].…”

Section: Introductionmentioning

confidence: 95%

“…If one defines the scattering vector 0 k k q r r r − = , where 0 k r and k r are respectively the incident and scattered wave vectors, the modulus of q r is simply related to the scattering angle 2θ θ λ π = sin 4 q (1) where λ is the wavelength of the incoming radiation. If one defines the scattering vector 0 k k q r r r − = , where 0 k r and k r are respectively the incident and scattered wave vectors, the modulus of q r is simply related to the scattering angle 2θ θ λ π = sin 4 q (1) where λ is the wavelength of the incoming radiation.…”

Section: Average Strainsmentioning

confidence: 99%

“…This trend is not simply a consequence of the steady miniaturization in electron devices [1]. Indeed structural crystallography has been very successful in locating with great precision the position of atoms within an individual unit cell.…”

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confidence: 99%

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X-ray scattering: a wonderful tool to probe lattice strains in materials with small dimensions

Thomas¹,

Loubens²,

Gergaud³

2004

MRS Proc.

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X-ray diffraction was recognized from the early days as highly sensitive to atomic displacements. Indeed structural crystallography has been very successful in locating with great precision the position of atoms within an individual unit cell. In disordered systems it is the average structure and fluctuations about it that may be determined. In the field of mechanics diffraction may thus be used to evaluate elastic displacement fields. In this short overview we give examples from recent work where x-ray diffraction has been used to investigate average strains in lines, films or multilayers. In small objects the proximity of surfaces or interfaces may create very inhomogeneous displacement fields. X-ray scattering is again one of the best methods to determine such distributions. The need to characterize displacement fields in nanostructures together with the advent of third generation synchrotron radiation sources has generated new and powerful methods (anomalous diffraction, coherent diffraction, microdiffraction, …). We review some of the recent and promising results in the field of strain measurements in small dimensions via X-ray diffraction. INTRODUCTIONSince the beginning of the nineties condensed matter physics has been increasingly concerned with properties of nm size objects. This trend is not simply a consequence of the steady miniaturization in electron devices [1]. It is also a result of fundamental discoveries, which show that new physical (magnetic, electronic, mechanical, …) properties appear at this scale. The search for specific size effects on physical properties should not shadow the influence of extremely high elastic strains inherent to these scales. Indeed it is now well established that materials in small dimensions [2] can sustain extremely high elastic strains. X-ray diffraction (XRD) has been recognized from the very early days [3,4] as a very sensitive tool to investigate lattice spacings and thus displacement fields. Homogeneous strains can be determined in a straightforward manner in ultrathin layers using synchrotron radiation. Strain fields are, however, Mater. Res. Soc. Symp. Proc. Vol. 840

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“…This trend is not simply a consequence of the steady miniaturization in electron devices [1]. This trend is not simply a consequence of the steady miniaturization in electron devices [1].…”

Section: Introductionmentioning

confidence: 95%

Section: Average Strainsmentioning

confidence: 99%

See 1 more Smart Citation

X-ray scattering: a wonderful tool to probe lattice strains in materials with small dimensions

Thomas¹,

Loubens²,

Gergaud³

2004

MRS Proc.

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“…One of them is commonly known as "Moore's Second Law", expressing the exponential increase in cost of production facilities, which threatens to render the next generation unaffordable by any one company within a decade or so. 1 A second, equally significant concern is the fact that miniaturization, while decreasing the cost of parts per se, does not decrease it for small numbers of parts.…”

Section: Introductionmentioning

confidence: 99%

Roll-to-roll manufacturing of thin film electronics

Sheats¹

2002

Emerging Lithographic Technologies VI

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The development and current status of roll-to-roll manufacturing processes and equipment relevant to the fabrication of patterned, active electronic devices such as thin film transistors (TFTs) is reviewed, along with a survey of the knowledge of processing for thin film electronics on flexible (especially polymer) substrates. It is concluded that while there are a number of unknowns and engineering challenges, there is no fundamental obstacle to the implementation of such processes, which will have profound value in production cost and product characteristics. The first amorphous silicon TFT made with roll-to-roll processing is reported.

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“…The so called Moore Law was consistently a controversial one given that the author defined technological growth in an exponential manner and in this case, one must note that there are physical restrictions that impose a limit to this curve. Based on this maximum limit, several studies (Reitter, 2003;Birnbaum & Williams, 2000;McGrath, 2005) either ponder the possible end of Moore´s Law or the need for its adaptation. An example of relevance is the publication of the International Technology Roadmap for Semiconductors (ITRS), which throughout the 2000´s conducted a series of revisions on the growth rate described by Moore´s Law.…”

Section: Introductionmentioning

confidence: 99%

AVALIAÇÃO DA LEI DE MOORE E PROPOSTA DE UM MODELO DE PREVISÃO ALTERNATIVO BASEADO EM TÉCNICAS DE EXTRAPOLAÇÃO DE TENDÊNCIAS <br><strong>DOI:10.7444/fsrj.v1i2.11</strong>

D'Emidio¹

2009

FSRJ

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This study's core objective is to validate whether the model proposed by Moore (1975) adequately describes the technological evolution of microprocessors. It further poses to verify whether this model is a feasible predictive tool and, finally, present an alternative model. To this extent, the forecasting technique method, based on historical data projections, will be applied. Statistical tests employed presented strong indications that the method proposed by Moore (1975) adequately described the evolution of processor component numbers during the 70s, 80s and 90s. As to the 2000s, however, the same cannot be affirmed and consequently the present study encountered grounding for the need to adapt the model to enable its application as a predictive tool. Key-words:Moore's Law. Forecast. Technological evolution. P R O F U T U R O : F U T U R E S T U D I E S P R O G R A MScientific Editor: James Terence Coulter Wright Evaluation: Double Blind Review, by SEER

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Physics and the Information Revolution

Cited by 39 publications

References 0 publications

X-ray scattering: a wonderful tool to probe lattice strains in materials with small dimensions

X-ray scattering: a wonderful tool to probe lattice strains in materials with small dimensions

Roll-to-roll manufacturing of thin film electronics

AVALIAÇÃO DA LEI DE MOORE E PROPOSTA DE UM MODELO DE PREVISÃO ALTERNATIVO BASEADO EM TÉCNICAS DE EXTRAPOLAÇÃO DE TENDÊNCIAS <br><strong>DOI:10.7444/fsrj.v1i2.11</strong>

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