Physicochemical processes at the boundary between some semiconducting solid solutions and contact alloys

Alieva, T. D.; Abdinova, G. D.; Akhundova, N. M.; Ismaiylova, R. A.; Abdinov, D. Sh.

doi:10.1134/s0036024409120231

Cited by 3 publications

(1 citation statement)

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“…4 Furthermore, the coating adhesion to the damaged layer will differ from that to a grain-oriented material. It was shown 5 that coating delamination occurs along the damaged layer where the cleavage planes are not perpendicular to the surface, as for the growth texture, but are parallel or at a slight slope angle to the surface.…”

Section: Resultsmentioning

confidence: 99%

Structure of Profiled Crystals Based on Solid Solutions of Bi2Te3 and Their X-Ray Diagnostics

Воронин¹,

Бублик

Tabachkova

et al. 2011

Journal of Elec Materi

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In this work, we used x-ray structural diagnostic data to reveal the formation of structural regularities in profiled polycrystalline ingots based on Bi and Sb chalcogenide solid solutions. In Bi 2 Te 3 lattice crystals, the solid phase grows such that the cleavage surfaces are perpendicular to the crystallization front. The crystallization singularity determines the nature of the growth texture. Because texture is an important factor determining the anisotropy of properties, which in turn determines the suitability of an ingot for production of modules and the possibility of figure of merit improvement, its diagnostics is an important issue for technology testing. Examples of texture analysis using the method of straight pole figure (SPF) construction for profiled crystals are provided. The structure of the surface layers in the profiled ingots was studied after electroerosion cutting. In addition, the method of estimation of the disturbed layer depth based on the nature of texture changes was used.

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Section: Resultsmentioning

confidence: 99%