Physicochemical, optical, and dielectric studies of physically vapor deposited amorphous thin Cu25-x (ZnGe)25-x Se50+2x films

Hassanien, Ahmed Saeed; Sharma, Ishu

doi:10.1016/j.jnoncrysol.2024.122887

Cited by 3 publications

(3 citation statements)

References 64 publications

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“…Likewise, to deduce the and 1 2 ε ε of the fabricated CATS 4 layers, the following relationships were used: [69][70][71] n k 21 Hot-probe instrument of the CATS 4 films.-The hot probe approach indicates that the CATS 4 films exhibit p-type conductivity. A sensitive multimeter and a soldering iron were the instruments employed in this process.…”

Section: Resultsmentioning

confidence: 99%

Structural, Optical and Optoelectrical Properties of CuAlSnS₄ Thin Films

El Radaf,

Al-Zahrani

2024

ECS J. Solid State Sci. Technol.

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The present study used chemical deposition to deposit thin copper aluminum tin sulfide (CATS4) layers onto clean glass substrates. X-ray diffraction analysis was utilized to explore the crystalline structure of the CATS4 films, which refers to the CATS4 films having a cubic crystal structure. Energy-dispersive X-ray analysis showed the presence of Cu, Al, Sn, and S peaks in the CATS4 films, and their atomic ratio is close to 1:1:1:4. Spectrophotometric measurements of optical transmittance and reflectance spanning the 400–2500 nm spectral range were performed to describe the optical properties of the CATS4 layers. The CATS4 films demonstrated a direct energy gap transition between 1.42 and 1.31 eV. Further, increasing the layer thickness enhanced the refractive index and Urbach energy of the CATS4 films. The inspected CATS4 films showed better optoelectrical properties with increasing thickness, including improved optical conductivity, optical resistivity, optical carrier concentration, relaxation time, and optical mobility. Increasing the thickness of the CATS4 films increased their nonlinear optical indices. Additionally, the hot probe apparatus verified the p-type semiconducting characteristics of CATS4 films.

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Section: Resultsmentioning

confidence: 99%

Structural, Optical and Optoelectrical Properties of CuAlSnS₄ Thin Films

El Radaf,

Al-Zahrani

2024

ECS J. Solid State Sci. Technol.

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“…The spectral transmittance (T) data are used to calculate the absorption coefficient (α) (Formula ( 11)) [73]. Subsequently, we calculate the optical band gap.…”

Section: Uv-vis Analysismentioning

confidence: 99%

“…However, at higher temperatures, such as 550 °C, a decrease in absorbance is observed, suggesting the possible formation of secondary phases or the loss of some optically active components. The spectral transmittance (T) data are used to calculate the absorption coefficient (α) (Formula ( 11)) [73]. Subsequently, we calculate the optical band gap.…”

Section: Uv-vis Analysismentioning

confidence: 99%

Photocatalytic Activities of Methylene Blue Using ZrO2 Thin Films at Different Annealing Temperatures

Acosta-Silva,

Gallardo-Hernández,

Rivas

et al. 2024

Coatings

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Tetragonal ZrO2, synthesized by the sol–gel method and dip-coating technique, was found to be photocatalytically active for the degradation of methylene blue. The ZrO2 thin films were characterized by X-ray diffraction (XRD), Raman spectroscopy, Fourier transform infrared spectroscopy (FTIR), scanning electron microscopy (SEM), and UV-vis spectroscopy. The photocatalytic degradation of methylene blue was carried out with this material. We identified the tetragonal phase in ZrO2 thin film at different annealing temperatures from 400 °C to 550 °C. The XRD study indicated that the films were monocrystalline in nature with preferred grain orientation along (011) plane and exhibited a tetragonal crystal structure. The crystallite size of the films increased with increasing annealing temperature. FTIR explained the bonding nature and confirmed the formation of the composite. UV-Vis showed the optical absorbance was high in the visible region and the optical band gap value increased with annealing temperature. The photocatalytic experimental results revealed that ZrO2 thin films degraded MB by 20%, 24%, 29%, and 36%, with annealing temperatures of 400 °C at 550 °C for 10 h, respectively. Our results provide useful insights into the development of photocatalytic materials and degradation of methylene blue.

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Characterizations and optical discussions of thermally evaporated titanium dioxide thin films

Özmenteş,

Hassanien

2024

J Opt

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Physicochemical, optical, and dielectric studies of physically vapor deposited amorphous thin Cu25-x (ZnGe)25-x Se50+2x films

Cited by 3 publications

References 64 publications

Structural, Optical and Optoelectrical Properties of CuAlSnS₄ Thin Films

Structural, Optical and Optoelectrical Properties of CuAlSnS₄ Thin Films

Photocatalytic Activities of Methylene Blue Using ZrO2 Thin Films at Different Annealing Temperatures

Characterizations and optical discussions of thermally evaporated titanium dioxide thin films

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Physicochemical, optical, and dielectric studies of physically vapor deposited amorphous thin Cu25-x (ZnGe)25-x Se50+2x films

Cited by 3 publications

References 64 publications

Structural, Optical and Optoelectrical Properties of CuAlSnS4 Thin Films

Structural, Optical and Optoelectrical Properties of CuAlSnS4 Thin Films

Photocatalytic Activities of Methylene Blue Using ZrO2 Thin Films at Different Annealing Temperatures

Characterizations and optical discussions of thermally evaporated titanium dioxide thin films

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Structural, Optical and Optoelectrical Properties of CuAlSnS₄ Thin Films

Structural, Optical and Optoelectrical Properties of CuAlSnS₄ Thin Films