Physically based rendering method to derive realistic simulation of chromatic confocal measurements
Dan Linnert,
Manuel Stavridis,
Ulrich Neuschaefer-Rube
et al.
Abstract:One important cause for limited traceability in optical metrology is the presence of systematic measurement errors caused by the interaction of the sensor and the measured object. These effects are complex and influenced by many factors, hence, they may differ significantly even among similar measurement systems. This also implies, that it is usually necessary to model the whole measurement chain including the relevant characteristics of the measured surface.We are currently developing a model of a chromatic c… Show more
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