Physical optics computer code optimized for synchrotron radiation

Chubar, Oleg; Elleaume, P.; Kuznetsov, Serguei; Snigirev, A.

doi:10.1117/12.481182

Cited by 51 publications

(23 citation statements)

References 0 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The collection geometry, and the calculated wavefront, for two characteristic wavelengths, are reported on Figure 12. Calculations have been performed using the software SRW developed by Oleg Chubar and Pascal Elleaume [94] and, later on, upgraded for propagating the wavefront along all optical elements, by O. Chubar. Figure 13 shows the emitted photon flux, expressed in Watts/cm -1 , a unit more familiar to spectroscopists.…”

Section: Infrared Methodsmentioning

confidence: 99%

Soleil a New Powerful Tool for Materials Science

Baudelet

Belkhou

Briois

et al. 2005

Oil & Gas Science and Technology - Rev. IFP

View full text Add to dashboard Cite

Résumé -SOLEIL, un nouvel outil puissant pour les sciences des matériaux -À l'aube des premiers photons disponibles sur l'anneau synchrotron de troisième génération SOLEIL, un état des possibilités offertes en sciences des matériaux sera présenté. La brillance exceptionnelle de cette machine permettra de réduire de plusieurs ordres de grandeur les temps d'acquisition typiques des différentes techniques synchrotrons (spectroscopie d'absorption-EXAFS, diffusion X aux petits et grands angles-SAXS et WAXS, diffraction des rayons X -XRD, spectroscopies et microscopie de photoélectrons -XPS et PEEM, etc.) les transformant en véritables techniques operando pour la caractérisation des matériaux et plus particulièrement des catalyseurs. La résolution spatiale à l'échelle de quelques microns et même submicronique, accessible par microdiffraction et microspectroscopie dans un domaine s'étendant de l'IR lointain aux X durs, pourra être mise à profit pour réaliser une cartographie atomiquement sélective de matériaux, du catalyseur hétérogène en action aux roches réservoirs. Un ensemble de techniques in situ permettra d'accéder à la réactivité de surfaces et de nanoparticules exposées à des flux gazeux contrôlés. La combinaison des techniques synchrotrons (diffraction, absorption et fluorescence X, etc.) ou l'apport d'informations complémentaires par combinaison simultanée de techniques classiques (Raman, UV-Vis, etc.) avec les techniques du synchrotron seront enfin un atout majeur pour la caractérisation operando des matériaux.Abstract -SOLEIL a New Powerful Tool for Materials Science -The first photons delivered by the third generation synchrotron source SOLEIL will be soon available for the scientific community. In this context, this paper presents an overview of the potentialities offered by this new machine for the study of materials. The outstanding brilliance of the SOLEIL source will enable to reduce by several orders of magnitude the data collection time for most of the synchrotron techniques (X-ray absorption spectroscopy -EXAFS, wide and small angle X-ray scattering -WAXS and SAXS, X-ray diffraction -XRD, photoelectron spectroscopy and microscopy-XPS and PEEM, etc.)

show abstract

Section: Infrared Methodsmentioning

confidence: 99%

Soleil a New Powerful Tool for Materials Science

Baudelet

Belkhou

Briois

et al. 2005

Oil & Gas Science and Technology - Rev. IFP

View full text Add to dashboard Cite

show abstract

“…2 shows the results of calculations of the spectra for three different electron beam energy spread values at εx= 0.98 nm (that was found to be the "best-fit" horizontal emittance value at the nominal horizontal beta-function value at the undulator center βx= 1.84 m). The calculations were done using a general method [2] with magnetic field distribution taken from measurements. To ensure good correspondence between the measured and calculated spectra, the magnetic field data was multiplied by a constant (~0.99), and the calculated spectra were normalized by maximum of the measured spectrum.…”

Section: On-axis Undulator Radiation Spectrummentioning

confidence: 99%

“…In many cases, detailed calculations not only allow for comparing real beamline performances against theoretical ones, but also help in accomplishing diagnostics of the radiation source and X-ray optics used in the beamline. High-accuracy simulation tools, covering both the processes of emission and propagation of the radiation through optical elements of beamlines, such as "Synchrotron Radiation Workshop" (SRW) [2], can greatly help in this respect [3], [4].…”

Section: Introductionmentioning

confidence: 99%

Initial performances of first undulator-based hard x-ray beamlines of NSLS-II compared to simulations

Chubar¹,

Chu²,

Huang³

et al. 2016

AIP Conference Proceedings

Self Cite

View full text Add to dashboard Cite

Early science commissioning results of the sub-micron resolution X-ray spectroscopy beamline (SRX) Abstract. Commissioning of the first X-ray beamlines of NSLS-II included detailed measurements of spectral and spatial distributions of the radiation at different locations of the beamlines, from front-ends to sample positions. Comparison of some of these measurement results with high-accuracy calculations of synchrotron (undulator) emission and wavefront propagation through X-ray transport optics, performed using SRW code, is presented.

show abstract

“…An example of a software program which allows the insertion of defects in the lens is SRW (Chubar et al, 2002).…”

Section: Computation Theory Associated With Porous Nanoberylliummentioning

confidence: 99%

Highly porous nanoberyllium for X-ray beam speckle suppression

Goikhman

Lyatun

Ershov

et al. 2015

J Synchrotron Radiat

View full text Add to dashboard Cite

This paper reports a special device called a 'speckle suppressor', which contains a highly porous nanoberyllium plate squeezed between two beryllium windows. The insertion of the speckle suppressor in an X-ray beam allows manipulation of the spatial coherence length, thus changing the effective source size and removing the undesirable speckle structure in X-ray imaging experiments almost without beam attenuation. The absorption of the nanoberyllium plate is below 1% for 1 mm thickness at 12 keV. The speckle suppressor was tested on the ID06 ESRF beamline with X-rays in the energy range from 9 to 15 keV. It was applied for the transformation of the phase-amplitude contrast to the pure amplitude contrast in full-field microscopy.

show abstract

Physical optics computer code optimized for synchrotron radiation

Cited by 51 publications

References 0 publications

Soleil a New Powerful Tool for Materials Science

Soleil a New Powerful Tool for Materials Science

Initial performances of first undulator-based hard x-ray beamlines of NSLS-II compared to simulations

Highly porous nanoberyllium for X-ray beam speckle suppression

Contact Info

Product

Resources

About