Physical Investigations of In2O3/Porous Silicon at Different Laser Wavelengths
Dua’a R. T. Alrayyes,
Makram A. Fakhri,
Ali A. Alwahib
et al.
Abstract:In this study, In2O3 thin films deposited on porous silicon using the pulsed laser deposition (PLD) method. The PSi substrate was prepared by photo electrochemical etching with the diode laser assistant. The impacts of various laser wavelengths on structural, spectroscopic, and performance characterizations were investigated. XRD revealed that the In2O3/PSi films have a polycrystalline cubic structure. The PL test showed measurements of two emission peaks related to In2O3 films (500, 463, 460 nm) and the PSi m… Show more
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