2018
DOI: 10.1016/j.solmat.2017.11.036
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Photovoltaic performance of CdS/CdTe junctions on ZnO nanorod arrays

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Cited by 55 publications
(23 citation statements)
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“…They inserted a thin CdS interlayer shell to provide more effective passivation to the ZnO surface and improved the PCE to 4% [202]. A similar discovery was also reported by Kartopu et al [203]. These reports show the influence of surface states and the importance of surface passivation.…”
Section: Challenges In Making Nw Solar Cellssupporting
confidence: 63%
“…They inserted a thin CdS interlayer shell to provide more effective passivation to the ZnO surface and improved the PCE to 4% [202]. A similar discovery was also reported by Kartopu et al [203]. These reports show the influence of surface states and the importance of surface passivation.…”
Section: Challenges In Making Nw Solar Cellssupporting
confidence: 63%
“…Utilizing double buffer layer device structure, the junction quality of CdTe solar cells was pronouncedly improved . Aiming for the ETL/absorber interface improvement, we modified our device structure by adding another buffer layer of ZnO between FTO and CdS layer.…”
Section: Resultsmentioning
confidence: 99%
“…Utilizing thicker ETL film would sacrifice short light absorption, while too thin CdS thickness may lead to short‐circuiting between rough FTO and absorber layer . To consider the benefits of CdS ETL and reduce the CdS thickness, it can be modified with an additional pre‐layer as used in CdTe solar cells . On the other hand, the FTO surface is highly rough which affected the physical contact between FTO and ETL .…”
Section: Introductionmentioning
confidence: 99%
“…SCAPS-1D is used for electrical simulations [20], and generation profiles are imported from optical simulations. Simulation parameters of solar cells used in SCAPS-1D are taken from the literature [21][22][23] and presented in Table S1. The four-terminal design (4T) is assumed for the tandem solar cell, whereby C 1−x Z x T and IBC c-Si are used as top and rear solar cells, respectively.…”
Section: Methodsmentioning
confidence: 99%
“…The spatial photoelectron generation profile is simulated optically, which is then imported to the electrical simulations. To present practical devices with a polycrystalline absorber, defect mechanisms are introduced in electrical simulations, such as surface and bulk recombination in the top cell absorber and transport layers (a lifetime of 10 ns is assumed for MZO and CdS), in agreement with experimental results [21][22][23]. The minority carrier lifetime is assumed to be 5 ns in top cell absorbers, and surface recombination velocity at the ETL/top cell absorber interface is taken as 500 cm/s.…”
Section: Electrical Simulationsmentioning
confidence: 99%