1999
DOI: 10.1366/0003702991947379
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Photothermal FT-IR Spectroscopy: A Step towards FT-IR Microscopy at a Resolution Better Than the Diffraction Limit

Abstract: We have used a miniaturized Wollaston wire resistive thermometer as a probe to record infrared absorption spectra of polymeric samples by detecting photothermally induced temperature fluctuations at the sample surface. This method opens the way to absorption Fourier transform infrared spectroscopy/microscopy with a spatial resolution that is no longer diffraction limited, but is determined instead by the size of the contact between probe and sample. At present, this is on the order of a few hundred nanometers.… Show more

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Cited by 123 publications
(84 citation statements)
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“…An emerging technique for obtaining maps with a spatial resolution of well below the diffraction limit is photothermal micro-spectroscopy (PTMS), alternatively known as PTTF (photothermal temperature fluctuation) (Hammiche et al 1999;Pollock and Smith 2002). This technique combines FTIR and atomic force microscopy (AFM) using scanning thermal microscopy.…”
Section: Fourier-transform Ir Spectroscopic Mapping and Imagingmentioning
confidence: 99%
“…An emerging technique for obtaining maps with a spatial resolution of well below the diffraction limit is photothermal micro-spectroscopy (PTMS), alternatively known as PTTF (photothermal temperature fluctuation) (Hammiche et al 1999;Pollock and Smith 2002). This technique combines FTIR and atomic force microscopy (AFM) using scanning thermal microscopy.…”
Section: Fourier-transform Ir Spectroscopic Mapping and Imagingmentioning
confidence: 99%
“…Scattering near-field microscopy (SNIM) is based on the detection of scattered light from an oscillating antenna i.e. an AFM cantilever tip to enable optical imaging with high lateral resolution [19][20][21][22][23][24][25]. This method uses a vibrating metallic AFM cantilever tip, which periodically and locally modifies the electromagnetic field distribution of the excitation laser which has been focused to a diffraction limited spot size.…”
Section: Infrared Absorption Imaging Based On Combining Atomic Force mentioning
confidence: 99%
“…Albeit with this limitation in recovering IR absorption information, SNIM IR imaging has been applied to image a number of systems with a spatial resolution of tens of nm [22]. SNIM has been applied to image functional materials such as insulator-to-metal transition in vanadium dioxide thin films [23]. This studied probed directly percolative insulator metal transition with temperature.…”
Section: Infrared Absorption Imaging Based On Combining Atomic Force mentioning
confidence: 99%
“…Although recent developments have stimulated great interest [1]- [4], the wealth of spectroscopic information available in this regime has thus remained untapped except in collective (far-field) measurements, such as Fourier-transform infrared spectroscopy (FTIR), which is a mainstay of chemical analysis.…”
Section: Introductionmentioning
confidence: 99%
“…A few groups [25], [26] have adapted this technique to probe samples at the 10.6-m (CO laser) wavelength since it readily accommodates conventional SPM tips, which serve double duty as scattering probes and topography sensors. groups have used total internal reflection tips [27] or heated tips as black body sources for local FTIR spectra [4].…”
Section: Introductionmentioning
confidence: 99%