1990
DOI: 10.1063/1.104167
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Photostimulated evaporation of SiO2 films by synchrotron radiation

Abstract: Irradiation by synchrotron radiation on SiO2 films induces continuous removal of this material at elevated temperatures. The photostimulated evaporation rate for a thermally grown SiO2 film increases steeply with temperature giving an activation energy of 0.7 eV. The experimental results indicate that photon-induced bond breaking assists decomposition and thermal desorption of the film. Applications to microfabrication of a line-and-space pattern and low-temperature cleaning of Si(100) surface are demonstrated. Show more

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Cited by 57 publications
(20 citation statements)
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“…However, in previous studies using synchrotron radiation, direct etching at room temperature proved impossible, and it was necessary either to heat the workpiece [14-16, 19, 21] or to use reactive gases [12,17,18,20,22]. In the former case, the etching rate improves as the temperature is raised to about 700 °C [16,19,21]. Thus, etching of SiO 2 and Si is possible using synchrotron radiation.…”
Section: Micromachining Of Transparent Materialsmentioning
confidence: 96%
“…However, in previous studies using synchrotron radiation, direct etching at room temperature proved impossible, and it was necessary either to heat the workpiece [14-16, 19, 21] or to use reactive gases [12,17,18,20,22]. In the former case, the etching rate improves as the temperature is raised to about 700 °C [16,19,21]. Thus, etching of SiO 2 and Si is possible using synchrotron radiation.…”
Section: Micromachining Of Transparent Materialsmentioning
confidence: 96%
“…However, in the previous studies using synchrotron radiation, direct etching at room temperature proved impossible; it was necessary either to heat up the workpiece [14-16, 19, 21], or to use reactive gases [12,17,18,20,22]. In the former case, the etching rate improves as the temperature is raised up to about 700 °C [16,19,21], and an activation energy of 0.7 eV is needed [21]. The etching rate of SiO 2 is more than an order of magnitude lower than that of Si [24], and therefore crystalline Si can be used as a mask for SiO 2 etching [19,21].…”
Section: Introductionmentioning
confidence: 97%
“…In the former case, the etching rate improves as the temperature is raised up to about 700 °C [16,19,21], and an activation energy of 0.7 eV is needed [21]. The etching rate of SiO 2 is more than an order of magnitude lower than that of Si [24], and therefore crystalline Si can be used as a mask for SiO 2 etching [19,21]. On the other hand, SiO 2 can be etched even at room temperature if synchrotron light is applied in an atmosphere of SF 6 or some other reactive gas.…”
Section: Introductionmentioning
confidence: 98%
“…It should be noted that the increase in the sample temperature T s may play a considerable role in desorption to enhance the etching rate for the synchrotron radiation processing, but would not take over the role of the X-ray photons in the dissociation. The Arrhenius-like plot for the etching rate [mm (100 mA) À1 min À1 ] gave a slope of 0.1 eV in our case for PTFE, smaller than 0.7 eV in the case of the synchrotron radiation direct photo-etching of SiO 2 (Akazawa et al, 1990), and much smaller than 3.6 eV, the activation energy for vacuum pyrolysis of PTFE (Single et al, 1964). As mentioned above, mass spectrometric analysis in the case of PTFE has also provided evidence that the dissociation of PTFE during the synchrotron radiation process is completely different from thermal dissociation.…”
mentioning
confidence: 99%
“…For synchrotron radiation, however, there have been few cases of the direct photo-etching process. The ®rst synchrotron radiation direct etching (termed`evaporation') was carried on SiO 2 by heating the sample to 1073 K (Akazawa et al, 1990). The etching rate increased signi®cantly with the temperature rise, but was very small (less than 7 Â 10 À3 mm min À1 ).…”
Section: Introductionmentioning
confidence: 99%