2011
DOI: 10.1103/physrevb.83.245201
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Photoreflectance study of the fundamental optical properties of (Ga,Mn)As epitaxial films

Abstract: Fundamental optical properties of thin films of (Ga,Mn)As diluted ferromagnetic semiconductor with a low (1%) and high (6%) Mn content and of a reference GaAs film, grown by low-temperature molecular-beam epitaxy, have been investigated by photoreflectance (PR) spectroscopy. In addition, the films were subjected to complementary characterization by means of superconducting quantum interference device (SQUID) magnetometry, Raman spectroscopy, and high resolution X-ray diffractometry. Thorough full-line-shape an… Show more

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Cited by 27 publications
(28 citation statements)
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“…4, we plot these results and compare them with other theoretical calculations and also with some experimental measurements available for small Mn composition. The values of Dietl et al 34 and Tsuruoka et al, 35 37 respectively, a very good agreement is seen between the theoretical and experimental results. Our GGA-1/2 findings are also endorsed by the theoretical calculations of Turek et al, 33 performed in a tight-binding framework.…”
supporting
confidence: 72%
“…4, we plot these results and compare them with other theoretical calculations and also with some experimental measurements available for small Mn composition. The values of Dietl et al 34 and Tsuruoka et al, 35 37 respectively, a very good agreement is seen between the theoretical and experimental results. Our GGA-1/2 findings are also endorsed by the theoretical calculations of Turek et al, 33 performed in a tight-binding framework.…”
supporting
confidence: 72%
“…These results are in agreement with the results of our earlier PR spectroscopy measurements for (Ga,Mn)As layers with Mn content of 1% and 2%. 15 On the other hand, in (Ga,Mn)As layers with much higher Mn content, of 4% and 6%, we revealed significant decrease in the bandgap-transition energy. 15 We interpreted those results in terms of a disordered valence band, formed as a result of merging the Mn Ga -related impurity band with the host GaAs valence band, which extended within the band gap with increasing Mn content in (Ga,Mn)As layer.…”
Section: Photoreflectance Results and Discussionmentioning
confidence: 86%
“…30 In our previous investigations, with (Ga,Mn)As layers of higher (up to 6%) Mn content and thicknesses up to 300 nm, we observed the below-band-gap feature in the PR spectra of all the layers. 15 The full-line-shape analysis of experimental PR spectra shown in Fig. 3, performed by using complex Airy functions and their derivatives, 31 …”
Section: Photoreflectance Results and Discussionmentioning
confidence: 99%
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