Si2H2 species were produced through the 193 nm excimer laser photolysis of Si2H6. Time‐resolved photoionization mass spectrometry was employed to study the reaction kinetics of Si2H2. The lower limit of self‐reaction of Si2H2 was estimated, k(Si2H2 + Si2H2) ≥ (1.7 ± 0.5) × 10−10 cm3 molecule−1 s−1, through analysis of the decay traces. This rate constant was independent of a total pressure on the entire pressure range (ptotal = 1–7 Torr). No reaction of Si2H2 with H2, CH4, SiH4, and Si2H6 was confirmed. The decay rates of Si2H2 reacting with O2, NO, and HCl exhibit negative dependence on the total pressure. © 2001 John Wiley & Sons, Inc. Int J Chem Kinet 33: 136–141, 2001